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Displaying 1-11 of 11 results for author "Microbeam Analysis Society."
X-ray spectrometry : XRS.
- Text
- [London] : Heyden, 1972-
- 1972-present
- 22 Items
Item details Format Call Number Item Location Text JSP 74-768 v. 32 (2003) Offsite Item details Format Call Number Item Location Text JSP 74-768 v. 33 (2004) Offsite Item details Format Call Number Item Location Text JSP 76-768 v. 34 (2005) Offsite Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
- Text
- New York : Wiley, [1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSF 75-1300 Offsite Introduction to analytical electron microscopy / edited by John J. Hren, Joseph I. Goldstein, and David C. Joy.
- Text
- New York : Plenum Press, c1979.
- 1979
- 1 Item
Item details Format Call Number Item Location Text JSF 80-1028 Offsite Eighth International Conference on X-ray Optics and Microanalysis and Twelfth annual conference of the Microbeam Analysis Society, August 18-24, 1977, Boston Sheraton, Boston, Massachusetts.
- Text
- [S. l. ; s. n. ; 1977?]
- 1977
- 1 Item
Item details Format Call Number Item Location Text JSF 81-307 Offsite Electron microscopy in forensic, occupational, and environmental health sciences / edited by Samarendra Basu and James R. Millette.
- Text
- New York : Plenum Press, c1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text JSF 87-1019 Offsite Proceedings, ... annual meeting, Electron Microscopy Society of America.
- Text
- San Francisco, CA : San Francisco Press, -1992.
- 1968-1992
- 30 Items
Item details Format Call Number Item Location Text OCA (Electron Microscopy Society of America. Proceedings [of the] annual meeting) v. 45 (1987) Offsite Item details Format Call Number Item Location Text OCA (Electron Microscopy Society of America. Proceedings [of the] annual meeting) v. 46 (1988) Offsite Item details Format Call Number Item Location Text OCA (Electron Microscopy Society of America. Proceedings [of the] annual meeting) v. 47 (1989) Offsite Proceedings, ... annual meeting, Microscopy Society of America.
- Text
- San Francisco, CA : San Francisco Press, 1993-1994.
- 1993-1994
- 2 Items
Item details Format Call Number Item Location Text JSM 94-627 51st (1-6 Aug. 1993) Offsite Item details Format Call Number Item Location Text JSM 94-627 52nd (31 July-5 Aug. 1994) Offsite Introduction to analytical electron microscopy / edited by John J. Hren, Joseph I. Goldstein, and David C. Joy.
- Text
- New York : Plenum Press, [1979], ©1979.
- 1979-1979
- 1 Item
Item details Format Call Number Item Location Text TA417.23.I57 Off-site Eighth International Congress on X-ray Optics and Microanalysis / edited by Donald R. Beaman, Robert E. Ogilvie, and David B. Wittry.
- Text
- Midland, Mich. : Pendell Pub. Co., 1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text QD79.M5 I57 1977 Off-site Proceedings, ... annual meeting, Electron Microscopy Society of America.
- Text
- San Francisco, CA : San Francisco Press, 1968-1992.
- 1968-1992
- 1 Item
Item details Format Call Number Item Location Text QH212.E4 E413b 1988 46th Off-site Electron microscopy 1990 : proceedings of the XIIth International Congress for Electron Microscopy, held in Seattle, Washington, USA, 12-18 August 1990 / editors, L.D. Peachey, D.B. Williams.
- Text
- San Francisco, CA : San Francisco Press, c1990.
- 1990
- 3 Items
Item details Format Call Number Item Location Text QH212.E4 I5 1990 Off-site Item details Format Call Number Item Location Text QH212.E4 I5 1990 Off-site Item details Format Call Number Item Location Text QH212.E4 I5 1990 v.4 Off-site
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