Research Catalog

  • XRAYL : a powder diffraction profile refinement program / C. R. Hubbard; J. M. Stewart; Y. Zhang; B. Morosin; E. L. Venturini.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1988.
    • 1988
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo95940

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