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Displaying 1-4 of 4 results for author "Murshed, Nabeel A."
Advances in document image analysis : First Brazilian Symposium, BSDIA'97, Curitabia, Brazil, November 2-5, 1997 : proceedings / Nabeel A. Murshed, Flávio Bortolozzi (eds.).
- Text
- Berlin ; London : Springer, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text JSE 97-1626 Offsite Advances in pattern recognition : ICAPR 2001 : second international conference, Rio de Janeiro, Brazil, March 11-14, 2001 : proceedings / Sameer Singh, Nabeel Murshed, Walter Kropatsch (eds.).
- Text
- Berlin ; New York : Springer, c2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Text JSE 01-792 Offsite Advances in document image analysis : first Brazilian symposium, BSDIA '97, Curitiba, Brazil, November 2-5, 1997 : proceedings / Nabeel A. Murshed, Flávio Bortolozzi (eds.).
- Text
- Berlin ; New York : Springer, [1997], ©1997.
- 1997-1997
- 1 Item
Item details Format Call Number Item Location Text TA1640 .B73 1997 Off-site Advances in pattern recognition : ICAPR 2001 : second international conference, Rio de Janeiro, Brazil, March 11-14, 2001 : proceedings / Sameer Singh, Nabeel Murshed, Walter Kropatsch (eds.).
- Text
- New York : Springer, 2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Text TK7882.P3 A34 2001 Off-site
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