Research Catalog

  • Stochastic reliability modeling, optimization and applications / editors, Syouji Nakamura, Toshio Nakagawa.

    • Text
    • Singapore ; Hackensack, NJ : World Scientific, c2010.
    • 2010
    • 1 Item
    FormatCall NumberItem Location
    Text TA169 .S77 2010Off-site
  • Stochastic reliability modeling, optimization and applications / editors, Syouji Nakamura, Toshio Nakagawa.

    • Text
    • Singapore ; Hackensack, NJ : World Scientific, ©2010.
    • 2010
    • 1 Item
    FormatCall NumberItem Location
    Text TA169 .S77 2010Off-site

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