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Displaying 1-44 of 44 results for author "National Institute of Standards and Technology (U.S.) http://id.loc.gov/authorities/names/n88112126"
Microlithography and metrology in micromachining : 23-24 October 1995, Austin, Texas / Michael T. Postek, chair/editor ; sponsored by SEMI--Semiconductor Equipment and Materials International, NIST--National Institute of Standards and Technology, SPIE--the International Society for Optical Engineering.
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- Bellingham, Wash. : SPIE, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TK7874 .M524 1995 Off-site Micromachining and microfabrication process technology : 23-24 October, 1995 Austin, Texas / Karen W. Markus, chair/editor ; sponsored by SEMI--Semiconductor Equipment and Materials International, NIST--National Institute of Standards and Technology, SPIE--The International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TK7874 .M537 1995 Off-site Microelectronic structures and microelectromechanical devices for optical processing and multimedia applications : 24 October, 1995, Austin, Texas / Wayne Bailey, M. Edward Motamedi, Fang-Chen Luo, chairs/editors ; sponsored by SEMI--Semiconductor Equipment and Materials International, NIST--National Institute of Standards and Technology, SPIE--The International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TK7874 .M523 1995 Off-site Micromachined devices and components : 23-24 October, 1995, Austin, Texas / Ray Roop, Kevin Chau, chairs/editors ; sponsored by SEMI--Semiconductor Equipment and Materials International, NIST--National Institute of Standards and Technology, SPIE--The International Society for Optical Engineering.
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- Bellingham, Wash., USA : SPIE, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text TK7874 .M538 1995 Off-site Atomic transition probabilities of carbon, nitrogen, and oxygen : a critical data compilation / W.L. Wiese, J.R. Fuhr and T.M. Deters.
- Text
- [Washington, D.C.] : American Chemical Society ; Woodbury, N.Y. : American Institute of Physics for the National Institute of Standards and Technology, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text QC174.26.A8 W437 1996q Off-site Heat capacity of liquids : critical review and recommended values / Milan Zábranský ... [et al.].
- Text
- [Washington, D.C.] : American Chemical Society ; Woodbury, N.Y. : American Institute of Physics for the National Institute of Standards and Technology, c1996.
- 1996
- 2 Items
Item details Format Call Number Item Location Text QD511 .H427 1996 vol.2 Off-site Item details Format Call Number Item Location Text QD511 .H427 1996 vol.1 Off-site COMPASS '96 : proceedings of the Eleventh Annual Conference on Computer Assurance : June 17-21, 1996, National Institute of Standards and Technology, Gaithersburg, MD : systems integrity, software safety, process security / COMPASS sponsors IEEE Aerospace and Electronics Systems Society, IEEE National Capital Area Council ; conference sponsors Arca Systems, Inc. ... [et al.].
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- Piscataway, NJ : IEEE Service Center, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text QA76.76.R44 C665 1996 Off-site Microlithography and metrology in micromachining II : 14-15 October 1996, Austin, Texas / Michael T. Postek, Craig Friedrich, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SEMI--Semiconductor Equipment and Materials International, NIST--National Institute of Standards and Technology.
- Text
- Bellingham, Wash. : SPIE, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2880 Off-site Micromachining and microfabrication process technology II : 14-15 October, 1996 Austin, Texas / Stella W. Pang, Shih-Chia Chang, chairs/editors ; sponsored by SPIE--The International Society for Optical Engineering, SEMI--Semiconductor Equipment and Materials International, NIST--National Institute of Standards and Technology ; cooperating organizations Solid State Technology, Sandia National Laboratories.
- Text
- Bellingham, Wash., USA : SPIE, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2879 Off-site Micromachined devices and components II : 14-15 October, 1996, Austin, Texas / Kevin Chau, Ray M. Roop, chairs/editors ; sponsored by SPIE--The International Society for Optical Engineering, SEMI--Semiconductor Equipment and Materials International, NIST--National Institute of Standards and Technology.
- Text
- Bellingham, Wash., USA : SPIE, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2882 Off-site Microelectronic structures and MEMS for optical processing II : 14-15 October, 1996, Austin, Texas / M. Edward Motamedi, Wayne Bailey, chairs/editors ; sponsored by SPIE--The International Society for Optical Engineering, SEMI--Semiconductor Equipment and Materials International, NIST--National Institute of Standards and Technology.
- Text
- Bellingham, Wash., USA : SPIE, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2881 Off-site Terrorism and counterterrorism methods and technologies : 20-21 November 1996, Boston, Massacusetts / Wade Ishimoto, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations National Institute of Justice ... [et al.].
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- Bellingham, Wash., USA : SPIE, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2933 Off-site Training, education, and liability issues for law enforcement scientists and engineers : 21 November 1996, Boston, Massacusetts / Trudy K. Overlin, Kathryn J. Stevens, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations National Institute of Justice ... [et al.].
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- Bellingham, Wash., USA : SPIE, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2939 Off-site Security systems and nonlethal technologies for law enforcement : 19, 21 November 1996, Boston, Massacusetts / John B. Alexander ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations National Institute of Justice ... [et al.].
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- Bellingham, Wash., USA : SPIE, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2934 Off-site National and international law enforcement databases : 19-20 November 1996, Boston, Massacusetts / George Works, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations National Institute of Justice ... [et al.].
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- Bellingham, Wash., USA : SPIE, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2940 Off-site Surveillance and assessment technologies for law enforcement : 19-20 November 1996, Boston, Massacusetts / A. Trent DePersia, Suzan Yeager, Steve Ortiz, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations National Institute of Justice ... [et al.].
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- Bellingham, Wash., USA : SPIE, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text TA1505 .P762 vol.2935 Off-site NIST-JANAF thermochemical tables / Malcolm W. Chase, Jr.
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- Washington, DC : American Chemical Society ; New York : American Institute of Physics for the National Institute of Standards and Technology, c1998.
- 1998
- 2 Items
Item details Format Call Number Item Location Text QD511.N577 1998 pt.2 Off-site Item details Format Call Number Item Location Text QD511.N577 1998 pt.1 Off-site Proceedings of the 1998 IEEE International Symposium on Intelligent Control (ISIC) : held jointly with IEEE International Symposium on Computational Intelligence in Robotics and Automation (CIRA), Intelligent Systems and Semiotics (ISAS) : September 14-17, 1998, National Institute of Standards and Technology, Gaithersburg, Maryland, USA / [sponsored by] NIST [and] IEEE.
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- Piscataway, New Jersey : IEEE, c1998.
- 1998
- 1 Item
Item details Format Call Number Item Location Text TJ212.2.I326 1998 Off-site Atlas of surface structures : based on the NIST Surface Structure Da tabase (SSD) / P.R. Watson, M.A. Van Hove, K. Hermann.
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- [Washington, DC] : American Chemical Society ; Woodbury, NY : Amer ican Institute of Physics, for the National Institute of Standards and Technology, c1994.
- 1994
- 2 Items
Item details Format Call Number Item Location Text QD506.A742 1994q vol. B Off-site Item details Format Call Number Item Location Text QD506.A742 1994q vol. A Off-site The Fourth Text REtrieval Conference (TREC-4) / D.K. Harman, editor.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, D.C. : For sale by the Supt. of Docs., U.S. G.P.O., 1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text QA76.9.T48T497 1995 Off-site Optical Technology Division.
- Text
- 2001
- 1 Item
Item details Format Call Number Item Location Text C 13.2:OP 7/2001 Off-site Solutions for manufacturers : Manufacturing Extension Partnership.
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- Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
- 2002
- 1 Item
Item details Format Call Number Item Location Text C 13.2:SO 4/2002 Off-site Technology at a glance.
- Text
- Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
- 19-present
- 2 Items
Item details Format Call Number Item Location Text C 13.75: July 1992 Off-site Item details Format Call Number Item Location Text C 13.75: Jan. 1992 Off-site Temperature, its measurement and control in science and industry. Volume 7 ; Proceedings of the Eighth International Temperature Symposium held 21-24 October 2002 in Chicago, Illinois/ Dean C. Ripple, editor-in-chief ; cosponsored by Instrumentation, Systems, and Automation Society, National Institute of Standards and Technology.
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- New York : American Institute of Physics, 2003.
- 2003
- 3 Items
Item details Format Call Number Item Location Text Off-site Not available - Please for assistance.Item details Format Call Number Item Location Text QC271 .T452 2003 pt.2 Off-site Item details Format Call Number Item Location Text QC271 .T452 2003 pt.1 Off-site Specifications and tolerances for reference standards and field standard weights and measures. 8, Specifications and tolerances for field standard weight carts / NIST Weight Cart Working Group ; editor, Val Miller.
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- [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text C 13.11:105-8 Off-site Characterization and metrology for ULSI technology / editors, David G. Seiler ... [et al.] ; sponsoring organizations, National Institute of Standards and Technology ... [et al.].
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- Melville, N.Y. : American Institute of Physics, 2005.
- 2005
- 2 Items
Item details Format Call Number Item Location Text Off-site Not available - Please for assistance.Item details Format Call Number Item Location Text TK7874.76 .C493 2005 Off-site Put NIST technology services to work for you.
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- [Gaithersburg, Md.?] : Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1998]
- 1998
- 1 Item
Item details Format Call Number Item Location Text C 13.2:T 22/9 Off-site Advanced Technology Program : proposal preparation guidelines, proposal solicitation - ATP 91-01 / U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology.
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- Gaithersburg, MD (Administration Building (Bldg. 101), Rm. A430, Gaithersburg 20899) : National Institute of Standards and Technology, Advanced Technology Program, [1991]
- 1991
- 1 Item
Item details Format Call Number Item Location Text C 13.6/2:AD 9 Off-site Software user's guide for the HAZARD I fire hazard assessment method / Richard D. Peacock ... [et al.].
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text C 13.11:146/991/v. 1 Off-site Report of the 77th National Conference on Weights and Measures 1992 / sponsored by the National Institute of Standards and Technology, attended by officials from the various states, counties, and cities, and representatives from U.S. government, industry, and consumer organizations, Nashville, Tennessee, July 19-23, 1992 ; report editors, Carroll S. Brickenkamp, Ph. D., Ann H. Turner.
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- Washington, D.C. : U.S. Dept. of Commerce, National Institute of Standards and Technology : For sale by the Supt. of Docs., U.S. G.P.O., 1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text C 13.10/3:992 Off-site Report of the 75th National Conference on Weights and Measures 1990 / sponsored by the National Institute of Standards and Technology, attended by officials from the various states, counties, and cities, and representatives from U.S. government, industry, and consumer organizations, Washington, DC July 9-13, 1990 ; report editors, Albert D. Tholen, Carroll S. Brickenkamp, Ann H. Turner.
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- Washington, D.C. : U.S. G.P.O. : For sale by the Supt. of Docs., 1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text C 13.10:793 Off-site Standards setting in the European Union, standards organizations and officials in EU standards activities / Roger A. Rensberger, Rene van de Zande, Helen Delaney.
- Text
- Gaithersberg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Text C 13.10:891/997 Off-site Composite materials for offshore operations : proceedings of the first international workshop, Houston, Texas, October 26-28, 1993 / edited by S.S. Wang, D.W. Fitting ; sponsored by Minerals Management Service, U.S. Department of the Interior, National Institute of Standards and Technology, U.S. Department of Commerce, University of Houston ; co- sponsored by Ameron ... [et al.].
- Text
- [Boulder, CO] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., [1995]
- 1995
- 1 Item
Item details Format Call Number Item Location Text C 13.10:887 Off-site The North American ISDN Users' Forum (NIUF) : minutes publication : June 22-24, 1999, Montreal, Canada : draft.
- Text
- [Gaithersburg, MD.? : National Institute of Standards and Technology, 1999]
- 1999
- 1 Item
Item details Format Call Number Item Location Text C 13.2:AM 3/2/999/DRAFT Off-site Ferdinand Rudolph Hassler, 1770-1843 : measuring the young republic / [edited by Lisa A. Greenhouse].
- Text
- Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1998]
- 1998
- 1 Item
Item details Format Call Number Item Location Text C 13.2:H 27 Off-site Helping manufacturers build a technological advantage : NIST Manufacturing Technology Centers Program.
- Text
- [Gaithersburg, Md.?] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1993]
- 1993
- 1 Item
Item details Format Call Number Item Location Text C 13.2:M 31/2 Off-site NIST in the 1990s.
- Text
- [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1991]
- 1991
- 1 Item
Item details Format Call Number Item Location Text C 13.2:Sci 2/9 Off-site Power quality.
- Text
- [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology, [1990]
- 1990
- 1 Item
Item details Format Call Number Item Location Text C 13.10:768 a Off-site Electronic publishing : guide to selection / Lynne S. Rosenthal.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text C 13.10:500-164 Off-site Power quality.
- Text
- [Gaithersburg, Md.?] : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Washington, D.C. : For sale by the Supt. of Docs., U.S. G.P.O., 1989]
- 1989
- 1 Item
Item details Format Call Number Item Location Text C 13.10:768 Off-site Laser induced damage in optical materials, 1989 : proceedings of the Boulder Damage Symposium, November 1-3, 1989 sponsored by National Institute of Standards and Technology ... [et al.] : October 1990 / edited by Harold E. Bennett ... [et al.].
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- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text QC374 .L37 1990 Off-site Laser induced damage in optical materials, 1986 : proceedings of a symposium / sponsored by National Institute of Standards and Technology (formerly National Bureau of Standards) ... [et al.] ; November 3-5, 1986, NIST (formerly NBS), Boulder, Colorado 80303 ; edited by Harold E. Bennett ... [et al.].
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text QC374 .L37 1988 Off-site Agriculture/food.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, [1989?]
- 1989
- 1 Item
Item details Format Call Number Item Location Text C 13.48/4:Ag 8 Off-site Digest / Conference on Precision Electromagnetic Measurements.
- Text
- Piscataway, NJ : IEEE
- 199-present
- 4 Items
Item details Format Call Number Item Location Text QC670 .C58 1998 Off-site Item details Format Call Number Item Location Text QC670 .C58 1996 Off-site Item details Format Call Number Item Location Text QC670 .C58 1994 Off-site
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