Research Catalog

  • Speckle metrology 2003 : proceedings : 18-20 June, 2003, Trondheim, Norway / editors, Kay Gastinger, Ole Johan Løkberg, Svein Winther ; sponsored and published by SINTEF (Norway), NTNU--Norwegian University of Science and Technology (Norway) ; cooperating organizations, SPIE--the International Society for Optical Engineering, EOS--European Optical Society.

    • Text
    • Bellingham, Wash. : SPIE, [2003], ©2003.
    • 2003-2003
    • 1 Item
    FormatCall NumberItem Location
    Text QC427.8.S64 S63 2003gOff-site

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