Research Catalog
New! Try our Article Search to discover online journals, books, and more from home with your library card.
Displaying 1-8 of 8 results for author "Podio, Fernando L."
CBEFF, Common Biometric Exchange File Format [microform] / Fernando L. Podio ... [et al.].
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2001]
- 2001
Monitoring and reporting techniques for error rate and error distribution in optical disk systems [microform] : proceedings of a workshop held in Colorado Springs, Colorado on August 5, 1991 / Fernando L. Podio, editor.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service], 1991.
- 1991
Test methods for optical disk media characteristics [microform] : for 356 mm ruggedized magneto-optic media / Fernando L. Podio, editor.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service], 1991.
- 1991
Monitoring and reporting techniques for error rate and error distribution in optical disk systems : proceedings of a workshop held in Colorado Springs, Colorado on August 5, 1991 / Fernando L. Podio, editor.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
- 1991
Emerging network storage management standards for intelligent data storage subsystems [microform] / Fernando Podio ... [et el.].
- Text
- Gaithersburg, MD : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, [1998]
- 1998
ANSI/NIST-ITL 1-2011 requirements and conformance test assertions / Christofer J. McGinnis, Dylan Yaga, Fernando L. Podio.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, [2011]
- 2011
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo28808Conformance test architecture and test suite for ANSI/NIST-ITL 1-2011 NIEM XML encoded transactions / Fernando L. Podio; Dylan Yaga; Christofer J. McGinnis.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013.
- 2013
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo95049Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado / sponsored by SPIE--the International Society for Optical Engineering, IDEMA, [and] Information Technology Lab./National Institute of Standards and Technology ; [Fernando Luis Podio, chair/editor].
- Text
- Bellingham, Wash., USA : SPIE, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TA1635 .R43 1999g Off-site
No results found from Digital Research Books Beta
Digital books for research from multiple sources world wide- all free to read, download, and keep. No Library Card is Required. Read more about the project.
