Research Catalog

  • Interferometry--applications : 22-23 July 1992, San Diego, California / Ryszard J. Pryutniewicz, Gordon M. Brown, Werner P.O. Jüptner, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text TA1555.I59 1993Off-site
  • Interferometry VI: applications : 14-15 July 1993, San Diego, California / Ryszard J. Pryutniewicz, Gordon M. Brown, Werner P.O. Jüptner, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by SEM--Society for Experimental Mechanics.

    • Text
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TA1555 .I592 1994Off-site
  • Interferometry VII :techniques and analysis : 11-12 July 1995, San Diego, California / Malgorzata, Kujawińska, Ryszard J. Pryutniewicz, Mitsuo Takeda, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by SEM--Society for Experimental Mechanics.

    • Text
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text TA1555 .I5932 1995Off-site
  • Interferometry--applications : 22-23 July 1992, San Diego, California / Ryszard J. Pryutniewicz, Gordon M. Brown, Werner P.O. Jüptner, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash. : The Society, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text TA1555 .I59 1993Off-site
  • Interferometry VII :techniques and analysis : 11-12 July 1995, San Diego, California / Malgorzata, Kujawińska, Ryszard J. Pryutniewicz, Mitsuo Takeda, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by SEM--Society for Experimental Mechanics.

    • Text
    • Bellingham, Wash. : SPIE--The Society, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text TA1555 .I5932 1995Off-site

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