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Displaying 1-1 of 1 results for author "Reith, Albrecht."
Stereology and morphometry in electron microscopy : problems and solutions / edited by Albrecht Reith, Terry M. Mayhew ; with a foreword by Edward R. Weibel.
- Text
- New York : Hemisphere Pub. Corp., [1988], ©1988.
- 1988-1988
- 1 Item
Item details Format Call Number Item Location Text RB43.5 .S74 1988 Off-site
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