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Displaying 1-4 of 4 results for author "Sanders, A. A."
Scanning system for measuring uniformity of laser detector response and laser beam dimensions [microform] / A.L. Rasmussen, W.E. Case, A.A. Sanders.
- Text
- Boulder, Colo. : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service, 1990]
- 1990
Improved low-level silicon-avalanche-photodiode transfer standards at 1.064 micrometers / A.L. Rasmussen, P.A. Simpson, A.A. Sanders.
- Text
- [Washington, D.C.] : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service, 1989]
- 1989
Improved low-level silicon-avalanche-photodiode transfer standards at 1.064 micrometers / A. L. Rasmussen; P. A. Simpson; A. A. Sanders.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1989.
- 1989
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo100438Scanning system for measuring uniformity of laser detector response and laser beam dimensions / A. L. Rasmussen; W. E. Case; A. A. Sanders.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1990.
- 1990
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo98900
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