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Displaying 1-3 of 3 results for author "Schwartz, Newton."
Measurement techniques for thin films. Edited by Bertram Schwartz and Newton Schwartz.
- Text
- New York, Electronics Division and Dielectrics and Insulation Division, Electrochemical Society [1967]
- 1967
- 1 Item
Item details Format Call Number Item Location Text VIB (Measurement techniques for thin films) Offsite Measurement techniques for thin films / edited by Bertram Schwartz and Newton Schwartz.
- Text
- New York : Johnson Reprint Corp., 1968, c1967.
- 1968-1967
- 1 Item
Item details Format Call Number Item Location Text 9335.627 Off-site Measurement techniques for thin films / edited by Bertram Schwartz and Newton Schwartz.
- Text
- New York : Johnson Reprint Corp., 1968, c1967.
- 1968-1967
- 1 Item
Item details Format Call Number Item Location Text 9335.627 Off-site
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