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Displaying 1-24 of 24 results for author "Seiler, David G."
Narrow-gap semiconductors and related materials / edited by David G. Seiler and C.L. Littler.
- Text
- Bristol ; New York : A. Hilger, c1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text JSG 91-172 Offsite Semiconductor characterization : present status and future needs / editors, W.M. Bullis, D.G. Seiler, A.C. Diebold.
- Text
- Woodbury, NY : American Institute of Physics, 1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text JSF 96-197 Offsite Characterization and metrology for ULSI technology : 1998 international conference, Gaithersburg, Maryland, March 1998 / editors, David G. Seiler ... [et al.].
- Text
- Woodbury, NY : American Institute of Physics, c1998.
- 1998
- 2 Items
Item details Format Call Number Item Location Text *WSC-1368 Offsite Item details Format Call Number Item Location Text JSF 00-804 Offsite Characterization and metrology for ULSI technology, 2000 : international conference, Gaithersburg, Maryland, 26-29 June 2000 / editors, David G. Seiler ... [et al.].
- Text
- Melville, NY : American Institute of Physics, 2001.
- 2001
- 2 Items
Item details Format Call Number Item Location Text *WSC-1938 Offsite Item details Format Call Number Item Location Text JSF 01-553 [Text] Offsite Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites [microform] / David G. Seiler ... [et al.].
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1994.
- 1994
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry [microform] / W. Murray Bullis, S. Perkowitz, D.G. Seiler.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995.
- 1995
Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003 / editors, David G. Seiler ... [et al.].
- Text
- Melville, N.Y. : American Institute of Physics, 2003.
- 2003
- 2 Items
Available Online
http://proceedings.aip.org/proceedings/confproceed/683.jspItem details Format Call Number Item Location Text *WSC-3886 Offsite Item details Format Call Number Item Location Text JSF 04-214 [Text] Offsite Characterization and metrology for ULSI technology / editors, David G. Seiler ... [et al.] ; sponsoring organizations, National Institute of Standards and Technology ... [et al.].
- Text
- Melville, N.Y. : American Institute of Physics, 2005.
- 2005
- 2 Items
Item details Format Call Number Item Location Text *WSC-4587 Offsite Item details Format Call Number Item Location Text JSF 05-797 [Text] Offsite Standard Reference Materials(R) User's Guide for RM 8096 and 8097 : The MEMS 5-in-1, 2013 Edition / Janet M. Cassard ... [and others].
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013.
- 2013
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo95021Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry / W. Murray Bullis, S. Perkowitz, D. G. Seiler.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1995.
- 1995
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo101552Semiconductor characterization : present status and future needs / editors, W.M. Bullis, D.G. Seiler, A.C. Diebold.
- Text
- Woodbury, NY : American Institute of Physics, 1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .S4457 1996 Off-site Characterization and metrology for ULSI technology : 1998 international conference, Gaithersburg, Maryland, March 1998 / editors, David G. Seiler [and others].
- Text
- Woodbury, NY : American Institute of Physics, [1998], ©1998.
- 1998-1998
- 2 Items
Item details Format Call Number Item Location Text TK7874.76 .C49 1998g book Off-site Item details Format Call Number Item Location Text TK7874.76 .C49 1998g CD-ROM Off-site Characterization and metrology for ULSI technology, 2000 : international conference, Gaithersburg, Maryland, 26-29 June 2000 / editors, David G. Seiler [and others].
- Text
- Melville, NY : American Institute of Physics, 2001.
- 2001
- 2 Items
Item details Format Call Number Item Location Text TK7874.76 .C49 2001g book Off-site Item details Format Call Number Item Location Text TK7874.76 .C49 2001g CD-ROM Off-site Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003 / editors, David G. Seiler ... [et al.].
- Text
- Melville, N.Y. : American Institute of Physics, 2003.
- 2003
- 1 Item
Available Online
http://proceedings.aip.org/proceedings/confproceed/683.jspItem details Format Call Number Item Location Text TK7874.76 .C49 2003g Off-site Characterization and metrology for ULSI technology / editors, David G. Seiler [and others] ; sponsoring organizations, National Institute of Standards and Technology [and others].
- Text
- Melville, N.Y. : American Institute of Physics, 2005.
- 2005
- 1 Item
Item details Format Call Number Item Location Text TK7874.76 .I56 2005g Off-site Narrow-gap semiconductors and related materials / edited by David G. Seiler and C.L. Littler.
- Text
- Bristol ; New York : A. Hilger, [1990], ©1990.
- 1990-1990
- 1 Item
Item details Format Call Number Item Location Text QC611.8.N35 N36 1990 Off-site The Spectroscopy of semiconductors / volume editors, David G. Seiler, Christopher L. Littler.
- Text
- Boston : Academic Press, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text QC610.9 .S4 vol. 36 Off-site Characterization and metrology for ULSI technology, 2000 : international conference, Gaithersburg, Maryland, 26-29 June 2000 / editors, David G. Seiler ... [et al.].
- Text
- Melville, NY : American Institute of Physics, 2001.
- 2001
- 1 Item
Available Online
http://scitation.aip.org/content/aip/proceeding/aipcp/550Item details Format Call Number Item Location Text TK7874.76.C492 2000 Off-site Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003 / editors, David G. Seiler ... [et al.].
- Text
- Melville, N.Y. : American Institute of Physics, 2003.
- 2003
- 2 Items
Item details Format Call Number Item Location Text Off-site Not available - Please for assistance.Item details Format Call Number Item Location Text TK7874.76 .C493 2003 Off-site Characterization and metrology for ULSI technology / editors, David G. Seiler ... [et al.] ; sponsoring organizations, National Institute of Standards and Technology ... [et al.].
- Text
- Melville, N.Y. : American Institute of Physics, 2005.
- 2005
- 2 Items
Item details Format Call Number Item Location Text Off-site Not available - Please for assistance.Item details Format Call Number Item Location Text TK7874.76 .C493 2005 Off-site Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New York, 11-15 May 2009 / editors, David G. Seiler ... [et al.]
- Text
- Melville, N.Y. : AIP Conference Proceedings, 2009.
- 2009
- 1 Item
Available Online
http://scitation.aip.org/content/aip/proceeding/aipcp/1173Item details Format Call Number Item Location Text TK7874.76.I573 2009 Off-site Physics and chemistry of mercury cadmium telluride and novel IR detector materials : San Francisco, CA 1990 / editor, David G. Seiler.
- Text
- 1991
- 1 Item
Item details Format Call Number Item Location Text QC611.8.M38P497 1991 Off-site Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March, 2003 / editors, David G. Seiler [and others] ; sponsoring organizations, National Institute of Standards and Technology [and others].
- Text
- Melville, N.Y. : American Institute of Physics, 2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text TK7874.76 .C493 2003 Off-site Physics and chemistry of mercury cadmium telluride and novel IR detector materials : San Francisco, CA 1990 / editor, David G. Seiler.
- Text
- New York : American Institute of Physics, c1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text QC611.8.M38 P497 1991 Off-site
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