Research Catalog

  • Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, USA / editors, Richard W. Siegel, Julia R. Weeterman, Robert Sinclair.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, c1987.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 88-1758Offsite
    Not available - Please for assistance.
  • Electronic structure and lattice defects in alloys : proceedings of the United States-Japan Seminar on Electronic Structure and Lattice Defects in Alloys held at the East-West Center, Honolulu, 4-8 May 1987 / guest editors, R.W. Siegel and F.E. Fujita.

    • Text
    • Aedermannsdorf, Switzerland ; Brookfield, VT : Trans Tech Publications, c1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 91-830Offsite
    Not available - Please for assistance.
  • Nanophase materials, synthesis, properties, applications : proceedings of the NATO Advanced Study Institute on Nanophase Materials, Synthesis, Properties, Applications, Corfu, Greece, June 20-July 2, 1993 / edited by George C. Hadjipanayis and Richard W. Siegel.

    • Text
    • Dordrecht ; Boston : Kluwer Academic Publishers, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 94-1372Offsite
    Not available - Please for assistance.
  • WTEC panel report on nanostructure science and technology : R & D status and trends in nanoparticles, nanostructured materials, and nanodevices / [edited by] Richard W. Siegel ... [et al.].

    • Text
    • Dordrecht ; Boston ; London : Kluwer Academic Publishers, c1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 00-47Offsite
    Not available - Please for assistance.
  • Nanophase materials, synthesis, properties, applications : proceedings of the NATO Advanced Study Institute on Nanophase Materials, Synthesis, Properties, Applications, Corfu, Greece, June 20-July 2, 1993 / edited by George C. Hadjipanayis and Richard W. Siegel.

    • Text
    • Dordrecht ; Boston : Kluwer Academic Publishers, [1994], ©1994.
    • 1994-1994
    • 1 Item
    FormatCall NumberItem Location
    Text TA418.9.N35 N38 1993Off-site
    Not available - Please for assistance.
  • WTEC panel report on nanostructure science and technology : R&D status and trends in nanoparticles, nanostructured materials, and nanodevices / [edited by] Richard W. Siegel [and others].

    • Text
    • Baltimore, Md. : International Technology Research Institute ; Dordrecht ; Boston : Kluwer Academic Publishers, [1999], ©1999.
    • 1999-1999
    • 1 Item
    FormatCall NumberItem Location
    Text TA418.9.N35 W74 1999Off-site
    Not available - Please for assistance.
  • Properties of atomic defects in metals : proceedings of the International Conference on the Properties of Atomic Defects in Metals, Argonne, Illinois, USA, 18-22 October, 1976 / editors: N. L. Peterson, R. W. Siegel.

    • Text
    • Amsterdam : North-Holland Pub. Co. : New York : sole distributors in the U.S. and Canada, Elsevier North-Holland, 1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text TN689.2 .I5395 1978Off-site
    Not available - Please for assistance.
  • Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, USA / editors, Richard W. Siegel, Julia R. Weertman, Robert Sinclair.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, [1987], ©1987.
    • 1987-1987
    • 1 Item
    FormatCall NumberItem Location
    Text TA418.5 .C48 1987Off-site
    Not available - Please for assistance.

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