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Displaying 1-1 of 1 results for author "Symposium on Advanced Characterization Techniques for Data Storage Materials (2003 : Boston, Mass.)"
Advanced data storage materials and characterizarion techniques : symposia held December 1-4, 2003, Boston, Massachusetts, U.S.A. / editors: Joachim W. Ahner ... [et al.].
- Text
- Warrendale, Pa. : Materials Research Society, c2004.
- 2004
- 1 Item
Item details Format Call Number Item Location Text TK7895.M4 A37 2003g Off-site
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