Research Catalog

  • Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99 : 5-9 July, 1999, Orchard Hotel, Singapore] / edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter [and others].

    • Text
    • Piscataway, New Jersey : IEEE, [1999], ©1999.
    • 1999-1999
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I684 1999gOff-site
  • Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2002 / edited by John Thong [and others] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in cooperation with Centre for IC Failure Analysis & Reliability, National University of Singapore.

    • Text
    • Piscataway, New Jersey : IEEE, [2002], ©2002.
    • 2002-2002
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I584 2002gOff-site

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