Research Catalog

  • Analysis of dimensional metrology standards / John Evans; Simon Frechette; John Horst; Hui Huang; Thomas Kramer; Elena Messina; Fred Proctor; Bill Rippey; Harry Scott; Ted Vorburger; Al Wavering.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2001.
    • 2001
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo99471

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