Research Catalog

  • Nondestructive evaluation of semiconductor materials and devices : [lectured presented at the NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, held at the Villa Tuscolano, Italy, September 19-29, 1978] / edited by Jay N. Zemel.

    • Text
    • New York : Plenum Press, c1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 80-961Offsite
  • Sensors : a comprehensive survey / edited by W. Göpel, J. Hesse, J.N. Zemel.

    • Text
    • Weinheim, Federal Republic of Germany ; New York, NY, USA : VCH, c1989-c1996.
    • 1989-1996
    • 11 Items
    FormatCall NumberItem Location
    Text JSL 93-86 v. 7Offsite
    FormatCall NumberItem Location
    Text JSL 93-86 v. 8Offsite
    FormatCall NumberItem Location
    Text JSL 93-86 v. 9Offsite
  • Sensors : a comprehensive survey / edited by W. Göpel, J. Hesse, J.N. Zemel.

    • Text
    • Weinheim, F.R.G. ; New York, NY, USA : VCH, ©1989-1996.
    • 1989-1996
    • 9 Items
    FormatCall NumberItem Location
    Text TA165 .S4585 1989 v.7Off-site
    FormatCall NumberItem Location
    Text TA165 .S4585 1989 v.8Off-site
    FormatCall NumberItem Location
    Text TA165 .S4585 1989 v.9Off-site
  • Proceedings of the Symposium on Microstructures and Microfabricated Systems / edited by P.J. Hesketh, J.N. Zemel, H.G. Hughes.

    • Text
    • Pennington, NJ : Electrochemical Society, [1994], ©1994.
    • 1994-1994
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .S9374 1994Off-site

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