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Displaying 1-1 of 1 results for author "Alford, Terry L."
Fundamentals of nanoscale film analysis / T.L. Alford, L. Feldman and J.W. Mayer.
- Text
- New York, N.Y. ; London : Springer, [2007], ©2007.
- 2007-2007
- 1 Item
Item details Format Call Number Item Location Text TA418.9.N35 A54 2007g Off-site
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