Research Catalog

  • Robust technology with analysis of interference in signal processing / Telman Aliev.

    • Text
    • New York : Kluwer Academic/Plenum Publishers, 2003.
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 03-1408Offsite
  • Digital noise monitoring of defect origin / Telman Aliev.

    • Text
    • Berlin : Springer, c2007.
    • 2007
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 07-1043Offsite

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