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Displaying 1-2 of 2 results for author "Aliev, T. A."
Robust technology with analysis of interference in signal processing / Telman Aliev.
- Text
- New York : Kluwer Academic/Plenum Publishers, 2003.
- 2003
- 1 Item
Item details Format Call Number Item Location Text JSE 03-1408 Offsite Digital noise monitoring of defect origin / Telman Aliev.
- Text
- Berlin : Springer, c2007.
- 2007
- 1 Item
Item details Format Call Number Item Location Text JSE 07-1043 Offsite
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