Research Catalog

  • Obstacle detection by recognizing binary expansion patterns [microform] / Yoram Baram and Yair Barniv.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1993]
    • 1993
  • Estimation and classification by sigmoids based on mutual information [microform] / Yoram Baram.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]
    • 1994

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