Research Catalog

  • Materials analysis by ion channeling : submicron crystallography / Leonard C. Feldman, James W. Mayer, S. Thomas Picraux.

    • Text
    • New York : Academic Press, 1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 84-165Offsite
  • Materials analysis by ion channeling : submicron crystallography / Leonard C. Feldman, James W. Mayer, S. Thomas Picraux.

    • Text
    • New York : Academic Press, 1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text QC176.8.C45 F44 1982Off-site
  • Fundamentals of surface and thin film analysis / Leonard C. Feldman, James W. Mayer.

    • Text
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text QD506 .F39 1986bOff-site
  • Fundamentals of surface and thin film analysis / Leonard C. Feldman, James W. Mayer.

    • Text
    • New York : North-Holland, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text QD506 .F39 1986Off-site

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