Research Catalog

  • Reliability of software intensive systems / Michael A. Friedman, Phuong Y. Tran, Peter L. Goddard.

    • Text
    • Park Ridge, N.J. : Noyes Data Corp., [1995], ©1995.
    • 1995-1991
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.76.R44 F75 1995Off-site
  • Software assessment : reliability, safety, testability / Michael A. Friedman, Jeffrey M. Voas.

    • Text
    • New York : Wiley, [1995], ©1995.
    • 1995-1995
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.76.Q35 F75 1995Off-site
  • Software assessment : reliability, safety, testability / Michael A. Friedman, Jeffrey M. Voas.

    • Text
    • New York, NY : John Wiley & Sons, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.76.Q35 F75 1995Off-site
  • Software assessment : reliability, safety, testability / Michael A. Friedman, Jeffrey M. Voas.

    • Text
    • New York : Wiley, ©1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.76.Q35 F75 1995Off-site

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