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Displaying 1-11 of 11 results for author "Heinrich, Kurt F. J."
Characterization of particles / Kurt F. J. Heinrich.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1980.
- 1980
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo95690Energy dispersive x-ray spectrometry / K. F. J. Heinrich, D. E. Newbury, R. L. Myklebust.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1981.
- 1981
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo101649Activities of the NBS spectrochemical analysis section July 1970 to June 1971 / Kurt F. J. Heinrich.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1972.
- 1972
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo102655Electron beam x-ray microanalysis / Kurt F. J. Heinrich.
- Text
- New York : Van Nostrand Reinhold Co., c1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text QD98.E4 H44 Off-site Present state of the classical theory of quantitative electron probe microanalysis [by] Kurt F. J. Heinrich.
- Text
- [Gaithersburg, Md.] U.S. National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off., Washington, 1970.
- 1970
- 1 Item
Item details Format Call Number Item Location Text QD117.M5x4 Off-site Scanning of electron probe microanalysis / Kurt F.J. Heinrich.
- Text
- Washington : U.S. National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off. , 1967.
- 1967
- 1 Item
Item details Format Call Number Item Location Text 8378.445 Off-site X-ray wavelength conversion tables and graphs for qualitative electron probe microanalysis [by] Kurt F.J. Heinrich and Mary Ann M. Giles.
- Text
- Washington, U.S. Dept. of Commerce, National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1967.
- 1967
- 1 Item
Item details Format Call Number Item Location Text 8294.444 Off-site An outline for cooperative action on the determination of x-ray mass attenuation coefficients in the wavelength range from 0.5 to 100 A (25 to 0.12 keV)
- Text
- Washington, For sale by the Superintendent of Documents, Govt. Print. Off., 1966.
- 1966
- 1 Item
Item details Format Call Number Item Location Text 8294.447 Off-site Scanning of electron probe microanalysis / Kurt F.J. Heinrich.
- Text
- Washington : U.S. National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off. , 1967.
- 1967
- 1 Item
Item details Format Call Number Item Location Text 8378.445 Off-site X-ray wavelength conversion tables and graphs for qualitative electron probe microanalysis [by] Kurt F.J. Heinrich and Mary Ann M. Giles.
- Text
- Washington, U.S. Dept. of Commerce, National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1967.
- 1967
- 1 Item
Item details Format Call Number Item Location Text 8294.444 Off-site An outline for cooperative action on the determination of x-ray mass attenuation coefficients in the wavelength range from 0.5 to 100 A (25 to 0.12 keV) / Kurt F.J. Heinrich.
- Text
- Washington, D.C. : National Bureau of Standards, 1966.
- 1966
- 1 Item
Item details Format Call Number Item Location Text 8294.447 Off-site
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