Research Catalog

  • Sixth International Conference on Quality Control by Artificial Vision : 19-22 May 2003, Gatlinberg, Tennessee, USA / Kenneth W. Tobin, Jr., Fabrice Meriaudeau, chairs/editors ; sponsored by UT-Battelle [and others] in cooperation with IEEE Signal Processing Society, SPIE--the International Society for Optical Engineering, [and] Machine Vision Association of SME--Society of Manufacturing Engineers (USA).

    • Text
    • Bellingham, Wash., USA : SPIE, [2003], ©2003.
    • 2003-2003
    • 1 Item
    FormatCall NumberItem Location
    Text TS156.2 .I566 2003gOff-site

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