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Displaying 1-1 of 1 results for author "International Test Conference. (27th : 1996 : Washington, D.C.)."
Proceedings, International Test Conference 1996.
- Text
- Altoona, PA : The Conference ; Piscataway N.J. : Additional copies can be ordered from the IEEE Service Center, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I593 1996 Off-site
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