Research Catalog

  • Stochastic modeling of crack initiation and short-crack growth under creep and creep-fatigue conditions [microform] / Takayuki Kitamura, Louis J. Ghosn, and Ryuichi Ohtani.

    • Text
    • [Washington, D.C.] : NASA ; [Springfield, Va. : For sale by the National Technical Information Service, 1989]
    • 1989

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