Research Catalog
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Displaying 1-3 of 3 results for author "Lee, Yooyoung."
Robust iris recognition baseline for the grand challenge / Yooyoung Lee; Ross J. Micheals; P. Jonathon Phillips; James J. Filliben.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2011.
- 2011
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo94577Sensitivity analysis for biometric systems : a methodology based on orthogonal experiment designs / Yooyoung Lee; Ross J. Micheals; P. Jonathon Phillips; James J. Filliben.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2012.
- 2012
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo96268Identifying face quality and factor measures for video / Yooyoung Lee; P. Jonathon Phillips; James J. Filliben; J. Ross Beveridge; Hao Zhang.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.
- 2014
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo99526
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