Research Catalog

  • Defect analysis in electron microscopy / M. H. Loretto and R. E. Smallman.

    • Text
    • London : Chapman and Hall ; New York : Wiley : distributed by Halstead Press, c1975.
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 76-978Offsite
  • Electron beam analysis of materials / M.H. Loretto.

    • Text
    • London ; New York : Chapman and Hall, 1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 86-1484Offsite
  • Electron beam analysis of materials / M.H. Loretto.

    • Text
    • London ; New York : Chapman & Hall, 1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TA417.23 .L67 1994Off-site
  • Defect analysis in electron microscopy / M. H. Loretto and R. E. Smallman.

    • Text
    • London : Chapman and Hall ; New York : Wiley : distributed by Halstead Press, [1975], ©1975.
    • 1975-1975
    • 1 Item
    FormatCall NumberItem Location
    Text QD921 .L67Off-site
  • Electron beam analysis of materials / M.H. Loretto.

    • Text
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text TA417.23 .L67 1984Off-site
  • Electron beam analysis of materials / M.H. Loretto.

    • Text
    • London ; New York : Chapman and Hall, 1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Text TA417.23 .L67 1984Off-site
  • Electron beam analysis of materials / M.H. Loretto.

    • Text
    • London ; New York : Chapman & Hall, 1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Text TA417.23 .L67 1994Off-site

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