Research Catalog

  • Electrical impact of SiC structural crystal defects on high electric field devices [microform] / Philip G. Neudeck.

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
    • 1999
  • An overview of silicon carbide device technology [microform] / Philip G. Neudeck and Lawrence G. Matus.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, 1992]
    • 1992

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