Research Catalog

  • Statistical analysis of microstructures in materials science / Joachim Ohser, Frank Mucklich.

    • Text
    • Chichester, England ; New York : John Wiley, c2000.
    • 2000
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 01-123Offsite
  • Statistical analysis of microstructures in materials science / Joachim Ohser, Frank Mücklich.

    • Text
    • Chichester [England] ; New York : John Wiley, [2000], ©2000.
    • 2000-2000
    • 1 Item
    FormatCall NumberItem Location
    Text TA407 .O35 2000Off-site
  • 3D images of materials structures : processing and analysis / Joachim Ohser and Katja Schladitz.

    • Text
    • Weinheim : Wiley-VCH, c2009.
    • 2009
    • 1 Item
    FormatCall NumberItem Location
    Text TA404.23 .O37 2009Off-site

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