Research Catalog

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  • Manufacturing metrology and standards for the health care enterprise program summary / Ram D. Sriram; Steven J. Fenves.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2008.
    • 2008
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo94710

  • NIST workshop on ontology evaluation / Ram D. Sriram; Conrad Bock; Fabian Neuhaus; Evan Wallace; Mary Brady; Mark A. Musen; Joanne S. Luciano.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2011.
    • 2011
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo99510

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