Research Catalog

  • Viewing technologies for CAD models / Michelle Potts Steves; Simon Frechette.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2003.
    • 2003
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo99569
  • Metric mapping concepts for TIA / Michelle Potts Steves; Jean Scholtz.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2004.
    • 2004
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo98427

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