Research Catalog

  • Fatigue crack growth under spectrum loads : a symposium presented at the Seventy-eighth Annual Meeting, American Society for Testing and Materials, Montreal, Canada, 23-24 June, 1975, R.P. Wei and R.I. Stephens, symposium cochairmen.

    • Text
    • Philadelphia : ASTM, 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text VEE (American Society for Testing Materials. Special technical publication. no. 595)Offsite

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