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Secondary electron emission spectroscopy of diamond surfaces [microform] / Isay L. Krainsky and Vladimir M. Asnin, Andre G. Petukhov.
- Text
- [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
- 1999
Uses of Auger and x-ray photoelectron spectroscopy in the study of adhesion and friction [microform] / Kazuhisa Miyoshi.
- Text
- [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1990]
- 1990
X-ray photoelectron spectroscopy (XPS), Rutherford back scattering (RBS) studies ... [microform] : final report for NAS8-39131 delivery order 7 / W.C. Neely, M.J. Bozak, and J.R. Williams.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1993]
- 1993
Studies of the nature of interfacial barriers in high efficiency crystalline silicon solar cells [microform] : final report for the period October 5, 1984 to October 4, 1985 / submitted by Clayton W. Bates, Jr.
- Text
- Pasadena, Calif. : California Institute of Technology, Jet Propulsion Laboratory ; [Springfield, Va. : National Technical Information Service, distributor, 1985]
- 1985
High resolution surface analysis by Microarea Auger analysis [microform] : computerization and characterization / R. Browning.
- Text
- Moffett Field, Calif. : National Aeronautics and Space Administration, Ames Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1985]
- 1985
Auger spectroscopy of hydrogenated diamond surfaces [microform] / I.L. Krainsky ... [et al.].
- Text
- [College Park, Md.] : American Physical Society ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
- 1997
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