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Displaying 1-50 of 155 results
Automatic Testing '80 Conference proceedings : Palais des Congrès, Paris, France, 23, 24, 25 September, 1980.
- Text
- Buckingham, Buckshire : Network, d1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text JSG 84-98 Offsite Automated support systems.
- Text
- [New York, RCA Defense Electronic Products, 1968]
- 1968
- 1 Item
Item details Format Call Number Item Location Text JSF 71-103 Offsite Proceedings.
- Text
- St. Louis.
- 19-19
- 1 Item
Item details Format Call Number Item Location Text JSP 74-254 1969-72 Offsite Diagnostika neispravnosteĭ Ė︠T︡SVM.
- Text
- Minsk, Izd-vo BGU, 1972.
- 1972
- 1 Item
Item details Format Call Number Item Location Text *QH 73-4627 Offsite Automatic testing: systems and applications / Roy Knowles.
- Text
- London ; New York : McGraw-Hill, c1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text JSE 76-946 Offsite Automatic testing / edited by N. O. Matthews.
- Text
- [Newport Pagnell : Network, 1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSD 78-229 Offsite Rational fault analysis / edited by Richard Saeks, Stanley R. Liberty.
- Text
- New York : M. Dekker, c1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Text JSE 78-1405 Offsite Autotestcon.
- Text
- [New York].
- 28 Items
Item details Format Call Number Item Location Text JSP 78-389 2003 Offsite Item details Format Call Number Item Location Text JSP 78-389 2004 Offsite Item details Format Call Number Item Location Text JSP 78-389 2005 Offsite Error detecting codes, self-checking circuits and applications / John Wakerly.
- Text
- New York : North-Holland, c1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text JSE 79-539 Offsite Automatic testing and evaluation of digital integrated circuits / James T. Healy.
- Text
- Reston, Va. : Reston Pub. Co., c1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text JSE 81-1084 Offsite IEEE guide to the use of ATLAS / sponsor, IEEE ATLAS Committee of the IEEE Standards Board.
- Text
- New York, N.Y. : Institute of Electrical and Electronics Engineers : [distributed in cooperation with Wiley-Interscience, c1980]
- 1980
- 1 Item
Item details Format Call Number Item Location Text JSF 81-143 Offsite Konferenzuntlerlagen =: Conference proceedings / Automatic Testing & Test and Measurement '81 ... Wiesbaden 23, 24, 25, 26 März 1981.
- Text
- Printers Mews, Market Hill, Buckingham, Bucks., Eng. : Network, c1981.
- 1981
- 2 Items
Item details Format Call Number Item Location Text JSG 82-15 Offsite Item details Format Call Number Item Location Text JSG 82-15 v. 3-4 Offsite Failure diagnosis and performance monitoring / L.F. Pau.
- Text
- New York : M. Dekker, c1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text JSE 81-1216 Offsite Computer controlled testing and instrumentation : an introduction to the IEC-625:IEEE-488 bus / Martin Colloms.
- Text
- New York : Wiley, c1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSD 85-383 Offsite LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey / sponsored by IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE.
- Text
- New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1979.
- 1979
- 1 Item
Item details Format Call Number Item Location Text JSF 83-273 Offsite Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
- Text
- Silver Spring, MD : IEEE Computer Society Press, 1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSF 84-138 Offsite Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 / sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE.
- Text
- Los Angeles, CA (P.O. Box 80452, Los Angeles 90080) : The Society, c1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text JSF 83-572 Offsite Conference record, 1982 Workshop on Industrial Applications of Machine Vision, May 3-5, 1982, Research Triangle Park, N.C.
- Text
- Los Angeles, CA : Available from IEEE Computer Society ; Piscataway, N.J. : IEEE Service Center [distributor] ; Silver Spring, MD : Published by IEEE Computer Society Press, 1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text JSF 83-684 Offsite Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983.
- Text
- Silver Spring, MD : IEEE Computer Society Press, c1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSF 84-137 Offsite Testing for space and weapon products : all-day symposium, Tuesday, 18 January 1983, presented at the Royal Aeronautical Society / [sponsored by] Astronautics & Guided Flight Section.
- Text
- London : The Society, [1983]
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSG 84-120 Offsite ATE Seminar/Exhibit : automated testing for electronics manufacturing : proceedings : June 8-11, 1981, John B. Hynes Veterans Auditorium, Boston, MA / organized and produced by Benwill Publishing Corporation.
- Text
- Boston, MA (1050 Commonwealth Ave., Boston 02215) : The Corp., c1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text JSF 84-613 Offsite IEEE ATPG workshop proceedings / Automatic Test Program Generation Workshop.
- Text
- Silver Spring, MD : IEEE Computer Society Press
- unknown-present
- 1 Item
Item details Format Call Number Item Location Text JSP 83-217 (1983) Offsite Automatic Testing 81 & Test Instrumentation : proceedings / [conference committee chairmen, R. Knowles, W. Barker ; committee, W. Bean ... et al.].
- Text
- Buckingham, Bucks. : Network, c1981.
- 1981
- 2 Items
Item details Format Call Number Item Location Text JSG 84-147 Offsite Item details Format Call Number Item Location Text JSG 84-147 V. 4-7 (INC.) Offsite ATE : automatic test equipment / Allan C. Stover.
- Text
- New York : McGraw-Hill Book Co., c1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text JSE 85-609 Offsite The three faces of test : design, characterization, production : International Test Conference, 1984 : proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
- Text
- Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text JSF 85-139 Offsite Interfacing test circuits with single-board computers / by Robert H. Luetzow.
- Text
- Blue Ridge Summit, Pa. : Tab Books, c1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSE 85-1591 Offsite Competent expert systems : a case study in fault diagnosis / E.T. Keravnou & L. Johnson.
- Text
- London : K. Page, 1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text JSD 88-888 Offsite Proceedings IEEE 1985 Workshop on Simulation & Test Generation Environments : September 17 & 18, 1985, San Francisco, California ; sponsors / IEEE Computer Society [and] Test Technology Committee.
- Text
- Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text JSF 86-900 Offsite Competent expert systems : a case study in fault diagnosis / E.T. Keravnou & L. Johnson.
- Text
- New York : MacGraw-Hill, 1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text JSE 88-1457 Offsite Computer integrated testing / edited by Allen Buckroyd.
- Text
- New York : Wiley, 1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text JSE 90-766 Offsite Neural models and algorithms for digital testing / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell.
- Text
- Boston : Kluwer Academic Publishers, c1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text JSE 91-1956 Offsite Temporally distributed symptoms in technical diagnosis / K. N"okel.
- Text
- Berlin ; New York : Springer-Verlag, c1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text JSF 91-964 Offsite Test & measurement world.
- Text
- Boston, MA : Interfield Pub. Co., c1981-
- 1981-present
- 29 Items
Item details Format Call Number Item Location PRINT JSP 92-130 Schwarzman Building - Main Reading Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Item details Format Call Number Item Location PRINT JSP 92-130 Schwarzman Building - Main Reading Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Item details Format Call Number Item Location PRINT JSP 92-130 Schwarzman Building - Main Reading Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Automatic test equipment / Keith Brindley.
- Text
- Oxford ; Boston : Newnes, 1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text JSE 92-1069 Offsite Proceedings, International Test Conference, 1992.
- Text
- Altoona, PA : International Test Conference ; Piscataway, NJ : Additional copies can be ordered from IEEE Service Center, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text JSF 93-96 Offsite Proceedings, International Test Conference, 1993.
- Text
- Altoona, PA : International Test Conference ; Piscataway, NJ : additional copies can be ordered from IEEE Service Center, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSF 94-128 Offsite Automation in electronic test equipment. Edited by David M. Goodman.
- Text
- [New York, Distributed by New York University Press] 1966-69.
- 1966-1969
- 7 Items
Item details Format Call Number Item Location Text TTE (Goodman, D. M. Automation in electronic test equipment) v. 5 Offsite Item details Format Call Number Item Location Text TTE (Goodman, D. M. Automation in electronic test equipment) v. 6 Offsite Item details Format Call Number Item Location Text TTE (Goodman, D. M. Automation in electronic test equipment) v. 7 Offsite Design-for-test for digital IC's and embedded core systems / Alfred L. Crouch.
- Text
- Upper Saddle River, NJ : Prentice Hall PTR, c1999.
- 1999
- 2 Items
Item details Format Call Number Item Location Text *WSC-3089 Offsite Item details Format Call Number Item Location Text JSE 00-23 (Main work) Offsite Final report submitted to National Aeronautics and Space Administration, George C. Marshall Space Flight Center ... entitled Study of eddy current probes [microform] / by Gary L. Workman and Morgan Wang.
- Text
- Huntsville, Ala. : Materials Processing Laboratory, Center for Automation & Robotics, University of Alabama in Huntsville ; [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1992]
- 1992
Millenium modem/channelizer special test equipment [microform] / William D. Ivancic.
- Text
- [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
- 1995
Applying independent verification and validation to automatic test equipment [microform] / by Cynthia C. Calhoun.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
- 1997
Automated equipment repair series [microform] : educational resources for the machine tool industry : course syllabi : instructor's handbook, student laboratory manual / MASTER, a consortium of educators and industry.
- Text
- [Washington, DC] : U.S. Dept. of Education, Office of Educational Research and Improvement, Educational Resources Information Center, [1998]
- 1998
A designer's guide to built-in self-test / Charles E. Stroud.
- Text
- Boston ; London : Kluwer Academic Publishers, c2002.
- 2002
- 1 Item
Item details Format Call Number Item Location Text JSE 02-1091 Offsite Multisensor instrumentation 6[sigma] design : defined accuracy computer-integrated measurement systems / Patrick H. Garrett.
- Text
- New York : J. Wiley, c2002.
- 2002
- 2 Items
Item details Format Call Number Item Location Text *WSE-3333 [Computer disk] Offsite Item details Format Call Number Item Location Text JSF 03-637 [Text] Offsite Automated testing of developmental satellite communications systems and subsystems [microform] / Kurt A. Shalkhauser and Robert J. Kerczewski.
- Text
- [Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center, 1985]
- 1985
Conference record : the IEEE Systems Readiness Technology Conference, September 21-24, 1992, Dayton Convention Center, Dayton, Ohio / sponsored by the Institute of Electrical and Electronics Engineers ... [et al.].
- Text
- New York, NY : IEEE ; Piscataway, NJ : May be obtained from IEEE Service Center, c1992.
- 1992
Proceedings, Autotestcon 93, September 20-23, 1993 : IEEE Systems Readiness Technology Conference, San Antonio Convention Center, San Antonio, Texas / sponsored by the Institute of Electrical and Electronics Engineers ... [et al.].
- Text
- Piscataway, NJ (445 Hoes Lane, Piscataway 08854) : May be ordered from Order Dept., IEEE, c1993.
- 1993
Ground software maintenance facility (GSMF) user's manual [microform] : final, appendices.
- Text
- Huntsville, Ala. : TRW Defense Systems Group, Huntsville Operations ; [Washington, DC : National Aeronautics and Space Administration, 1986]
- 1986
Test & measurement world [electronic resource].
- Text
- [Boston, MA] : [Interfield Pub. Co.], [©1981]-
- 1981-present
- 2 Resources
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Temporally distributed symptoms in technical diagnosis / K. N"okel.
- Text
- Berlin ; New York : Springer-Verlag, [1991], ©1991.
- 1991-1991
- 1 Item
Item details Format Call Number Item Location Text TA169.6 .N65 1991g Off-site
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