Research Catalog
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Displaying 1-18 of 18 results
Characterization of the relationship of the cure cycle chemistry to cure cycle processing properties [microform] : semi-annual report, NASA research grant NAG 1-237 / David E. Kranbuehl.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1986]
- 1986
P-polarized reflectance spectroscopy [microform] : a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions / Nikolaus Dietz and Klaus J. Bachmann.
- Text
- [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995?]
- 1995
Ellipsometric study of YBa₂Cu₃O₇₋x laser ablated and co-evaporated films [microform] / S.A. Alterovitz ... [et al.] ; prepared for the International Conference on Electronic Materials 1990, sponsored by the Materials Research Society, Newark, New Jersey, September 17-19, 1990.
- Text
- [Washington, D.C.] : NASA ; [Springfield, Va. : For sale by the National Technical Information Service, 1990?]
- 1990
Report for period ending July 31, 1985 ... entitled Characterization of the relationship of the cure cycle chemistry to cure cycle processing properties [microform] / David E. Kranbuehl, principal investigator.
- Text
- Williamsburg, Va. : College of William and Mary, Dept. of Chemistry ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1985]
- 1985
Low temperature characterization of ceramic and film power capacitors [microform] / Ahmad Hammoud and Eric Overton.
- Text
- [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
- 1996
The charging of composites in the space environment [microform] / by Steven A. Czepiela.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
- 1997
Reflection coefficients on surfaces of different periodic structure [microform] / Pengfei Niu, Al Kogut.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
- 1997
Structure-property relationships of bismaleimides [microform] : a dissertation ... / Anita D. Tenteris-Noebe.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
- 1997
Investigation of creep properties in RAINBOW high displacement actuators [microform] : final report ... period--May 1, 1996 - July 30, 1997 / Gene Haertling ... [et al.].
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
- 1997
Performance of surface-mount ceramic and solid tantalum capacitors for cryogenic applications [microform] / Ahmad Hammoud ... [et al.].
- Text
- [Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1998]
- 1998
Characteristic impedance of microstrip lines [microform] / M.C. Bailey and M.D. Despande.
- Text
- Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [1989]
- 1989
- 1 Resource
Available Online
http://purl.access.gpo.gov/GPO/LPS70014Radar response from vegetation with nodal structure [microform] / Bruce J. Blanchard, Peggy E. O'Neill.
- Text
- Greenbelt, Md. : National Aeronautics and Space Administration, Goddard Space Flight Center, [1984]
- 1984
Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction) / principal investigators : J. Lally and R. Meister.
- Text
- [Washington, D.C.] : Department of Electrical Engineering, Catholic University of America : National Aeronautics and Space Administration, 11 July 1993.
- 1983-711
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo51162Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction) / principal investigators: J. Lally and R. Meister.
- Text
- [Washington, District of Columbia] : Department of Electrical Engineering, Catholic University of America : National Aeronautics and Space Administration, 11 July 1983.
- 1983-711
Low temperature characterization of ceramic and film power capacitors / Ahmad Hammoud and Eric Overton.
- Text
- Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center, September 1996.
- 1996-9
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo70073Electromagnetic nondestructive evaluation of wire insulation and models of insulation material properties / Nicola Bowler [and four others].
- Text
- Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2012]
- 2012
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo32904Thermal and dielectric properties of a homogeneous moon based on microwave and infrared temperature observations / by Ted A. Calvert.
- Text
- Washington, D.C. : National Aeronautics and Space Administration, February 1969.
- 1969-2
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo171337Handbook of dielectric and thermal properties of materials at microwave frequencies / Vyacheslav V. Komarov.
- Text
- Boston : Artech House, [2012], ©2012.
- 2012-2012
- 1 Item
Item details Format Call Number Item Location Text TA418.6 .K66 2012g Off-site
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