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Narrow bandgap semiconducting silicides [microform] : intrinsic infrared detectors on a silicon chip : final report / principal investigator, John E. Mahan.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1990]
- 1990
Structural characterization and gas reactions of small metal particles by high-resolution, in-situ tem and ted [microform].
- Text
- Sunnyvale, CA : Eloret Institute ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1984]
- 1984
Surface diagnostics in tribology technology and advanced coatings development [microform] / Kazuhisa Miyoshi.
- Text
- [Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
- 1999
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