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Displaying 1-50 of 540 results
Ultramicrotomy [by] R. L. Griffin.
- Text
- London, Baillière Tindall, 1972.
- 1972
- 1 Item
Item details Format Call Number Item Location Text JSD 74-906 Offsite Specimen preparation in materials science, [by] P. J. Goodhew.
- Text
- Amsterdam, North-Holland Pub. Co., New York, American Elsevier Pub. Co., 1973 [c1972]
- 1973-1972
- 1 Item
Item details Format Call Number Item Location Text JSD 75-202 Offsite Defect analysis in electron microscopy / M. H. Loretto and R. E. Smallman.
- Text
- London : Chapman and Hall ; New York : Wiley : distributed by Halstead Press, c1975.
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSE 76-978 Offsite Developments in electron microscopy and analysis : proceedings of EMAG 75 held at the University of Bristol, 8-11 September 1975 / edited and introduced by J. A. Venables.
- Text
- London : New York ; Academic Press, 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text JSF 76-1128 Offsite Electron microscopy of enzymes: principles and methods, edited by M. A. Hayat.
- Text
- New York, Van Nostrand Reinhold [1973-77]
- 1973-1977
- 5 Items
Item details Format Call Number Item Location Text JSK 76-241 Library has: Vol. 1-5. v. 3 Offsite Item details Format Call Number Item Location Text JSK 76-241 Library has: Vol. 1-5. v. 4 Offsite Item details Format Call Number Item Location Text JSK 76-241 Library has: Vol. 1-5. v. 5 Offsite Electron microscopy 1974 : abstracts of papers presented to the Eighth International Congress on Electron Microscopy, held in Canberra, Australia, August 25-31, 1974 / edited by J. V. Sanders and D. J. Goodchild.
- Text
- Canberra : Australian Academy of Science, [1974?]
- 1974
- 2 Items
Item details Format Call Number Item Location Text JSF 77-458 v. 1 Offsite Item details Format Call Number Item Location Text JSF 77-458 v. 2 Offsite Electron microscopy in the study of materials / [by] P. J. Grundy and G. A. Jones.
- Text
- London : Edward Arnold, 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text JSE 77-1008 Offsite Practical electron microscopy in materials science / J. W. Edington.
- Text
- New York : Van Nostrand Reinhold Co., 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text JSG 78-1 Offsite Ultrahistochemie: histochem. Arbeitsvorschriften f. d. Elektronenmikroskopie; mit 12 Tab./ Günther Geyer. - 2., überarb. u. erw. Aufl.
- Text
- Stuttgart : Fischer, VEB, 1973.
- 1973
- 1 Item
Item details Format Call Number Item Location Text JSD 77-953 Offsite Failure analysis with the electron microscope, by Nathan A. Tiner.
- Text
- Los Angeles, Fox-Mathis publications [c1973]
- 1973
- 1 Item
Item details Format Call Number Item Location Text JSE 78-302 Offsite Typical electron microscope investigations / [by] J. W. Edington.
- Text
- London : Macmillan, 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text JSF 78-1172 Offsite Electron microscope specimen preparation techniques in materials science / [by] K. C. Thompson-Russell and J. W. Edington.
- Text
- London : Macmillan, 1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Text JSF 79-80 Offsite Electron microscopy and x-ray applications to environmental and occupational health analysis / edited by Philip A. Russell, Alan E. Hutchings.
- Text
- Ann Arbor, Mich. : Ann Arbor Science Publishers, c1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text JSE 79-138 Offsite Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt. 2d, rev. ed.
- Text
- Amsterdam ; New York : North-Holland Pub. Co. : sole distributors for the U. S.A. and Canada, Elsevier North-Holland, 1978.
- 1978
- 2 Items
Item details Format Call Number Item Location Text JSD 79-741 v. 1 Offsite Item details Format Call Number Item Location Text JSD 79-741 v. 2 Offsite Strukturen kristalliner Phasengrenzen ; Elektronenmikroskopischer Bildkontrast / hrsg. von Helmut Günther Schneider und Jörg Woltersdorf (Federführung). 1. Aufl.
- Text
- Leipzig : Deutscher Verlag für Grundstoffindustrie, [1977?]
- 1977
- 1 Item
Item details Format Call Number Item Location Text JSE 79-976 Offsite Electron diffraction in the electron microscope [by] J. W. Edington.
- Text
- [Eindhoven, N. V. Philips' Gloeilampenfabrieken, 1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSF 78-1200 Offsite Interpretation of transmission electron micrographs [by] J. W. Edington.
- Text
- [Eindhoven, N. V. Philips' Gloeilampenfabrieken, 1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSF 78-1198 Offsite Staining methods for sectioned material [by] P. R. Lewis [and] D. P. Knight.
- Text
- Amsterdam, New York, North-Holland Pub. Co., 1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Text JSD 79-318 Offsite Australian Conference on Electron Microscopy. Sponsored by the Australian Academy of Science.
- Text
- [Canberra, 1972]
- 1972
- 1 Item
Item details Format Call Number Item Location Text JSD 79-119 Offsite Microscopie électronique, 1970; résumés des communications présentées au septième congrès international, Grenoble, 30 Août-5 Septembre, 1970. Édité par Pierre Favard.
- Text
- [Paris, Société Française de Microscopie Électronique] 1970.
- 1970
- 2 Items
Item details Format Call Number Item Location Text JSK 79-53 v. 1 (1970) Offsite Item details Format Call Number Item Location Text JSK 79-53 v. 2 (1970) Offsite Electron microscopy 1978 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978 / editor, J. M. Sturgess ; associate editors, V. I. Kalnins, F. P. Ottensmeyer, G. T. Simon].
- Text
- Toronto : Microscopical Society of Canada, c1978.
- 1978
- 3 Items
Item details Format Call Number Item Location Text JSF 80-195 v. 1 Offsite Item details Format Call Number Item Location Text JSF 80-195 v. 2 Offsite Item details Format Call Number Item Location Text JSF 80-195 v. 3 Offsite Ultramicroscopy.
- Text
- Amsterdam, North-Holland Pub. Co.
- 1975-present
- 50 Items
Item details Format Call Number Item Location Text JSP 80-80 v. 96-98 (2003) Offsite Item details Format Call Number Item Location Text JSP 80-80 v. 98-100 (2004) Offsite Item details Format Call Number Item Location Text JSP 80-80 v. 100-102 (2004-2005) Offsite Transmission electron microscopy of materials / Gareth Thomas, Michael J. Goringe.
- Text
- New York : Wiley, c1979.
- 1979
- 1 Item
Item details Format Call Number Item Location Text JSE 80-448 Offsite Introduction to analytical electron microscopy / edited by John J. Hren, Joseph I. Goldstein, and David C. Joy.
- Text
- New York : Plenum Press, c1979.
- 1979
- 1 Item
Item details Format Call Number Item Location Text JSF 80-1028 Offsite Introduction to electron microscopy / by Saul Wischnitzer.
- Text
- New York : Pergamon Press, 1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text JSE 81-1042 Offsite Experimental high-resolution electron microscopy / John C. H. Spence.
- Text
- Oxford : Clarendon Press ; New York : Oxford University Press, 1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text JSD 81-446 Offsite Electron microscopy of materials : an introduction / Manfred von Heimendahl ; translated by Ursula E. Wolff.
- Text
- New York : Academic Press, 1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text JSE 81-846 Offsite Proceedings : thirty-fifth annual meeting, Electron Microscopy Society of America, Boston, Massachusetts, August 22-26, 1977. Editor G. W. Bailey.
- Text
- Baton Rouge, La. : Claitor's Publishing Division, 1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Text JSF 80-1123 Offsite Journal of electronmicroscopy.
- Text
- Tokyo : Society of Electron-Microscopy, Japan, 1953-1964.
- 1953-1964
- 1 Item
Item details Format Call Number Item Location Text OCA (Journal of electronmicroscopy) v. 1-6 (1953-58) Offsite Journal of electron microscopy / Japanese Society of Electron Microscopy.
- Text
- [Tokyo, Japan] : The Society, 1964-
- 1964-present
- 14 Items
Item details Format Call Number Item Location Text JSP 84-208 v. 43 (1994) Offsite Item details Format Call Number Item Location Text JSP 84-208 v. 44 (1995) Offsite Item details Format Call Number Item Location Text JSP 84-209 v. 45 (1996) Offsite Electron microscopy and analysis, 1981 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Cambridge, 7-10 September 1981 (EMAG 81) / edited by M.J. Goringe.
- Text
- Bristol : Institute of Physics, 1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text JSK 77-69 no. 61 v. 61 (1981) Offsite Electron microscopy, 1980 : proceedings of the Seventh European Congress on Electron Microscopy, The Hague, The Netherlands, August 24-29, 1980.
- Text
- Leiden : Seventh European Congress on Electron Microscopy Foundation, 1980.
- 1980
- 4 Items
Item details Format Call Number Item Location Text JSK 82-116 v. 2 Biology Offsite Item details Format Call Number Item Location Text JSK 82-116 v. 3 Analysis Offsite Item details Format Call Number Item Location Text JSK 82-116 v. 4 High Voltage Offsite Electron microscopy at molecular dimensions : state of the art and strategies for the future / edited by Wolfgang Baumeister.
- Text
- Berlin ; New York : Springer-Verlag, 1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text JSE 82-468 Offsite Dian zi xian wei shu / Guang Dinglu bian zhu.
- Text
- Shanghai : Zhi shi chu ban she, 1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text *OVL 83-255 Offsite Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.
- Text
- New York : Marcel Dekker, c1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text JSF 83-370 Offsite Principles and practice of electron microscope operation / [by] Alan W. Agar, Ronald H. Alderson, Dawn Chescoe.
- Text
- Amsterdam ; Oxford : North-Holland Pub. Co. ; New York : Elsevier, 1974.
- 1 Item
Item details Format Call Number Item Location Text JSD 83-167 Offsite Not available - In use until 2024-01-26 - Please for assistance.Transmission electron microscopy of silicon VLSI circuits and structures / R.B. Marcus and T.T. Sheng.
- Text
- New York : Wiley, c1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSF 85-709 Offsite Electron microscopy 1982 : paper presented at the 10th International Congress on Electron Microscopy held in Hamburg, West Germany, August 17-24, 1982 / editor, The Congress Organizing Committee.
- Text
- Frankfurt/ Main : Deutsche Gesellschaft für Elektronenmikroskopie, c1982.
- 1982
- 3 Items
Item details Format Call Number Item Location Text JSD 84-188 v. 1 Offsite Item details Format Call Number Item Location Text JSD 84-188 v. 2 Offsite Item details Format Call Number Item Location Text JSD 84-188 v. 3 Offsite Microbial ultrastructure : the use of the electron microscope / edited by R. Fuller and D. W. Lovelock.
- Text
- London ; New York : Academic Press, 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text JSE 84-920 Offsite The early development of electron lenses and electron microscopy / by Ernst Ruska ; transl. by Thomas Mulvey.
- Text
- Stuttgart : Hirzel, 1980.
- 1980
- 1 Item
Item details Format Call Number Item Location Text JSE 83-1063 Offsite Electron beam analysis of materials / M.H. Loretto.
- Text
- London ; New York : Chapman and Hall, 1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text JSE 86-1484 Offsite Microscopy of semiconducting materials, 1983 : proceedings of the Institute of Physics Conference held in St Catherine's College, Oxford, 21-23 March 1983 / edited by A.G. Cullis, S.M. Davidson and G.R. Booker.
- Text
- Bristol [Avon] : Institute of Physics, c1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSK 77-69 no. 67 v. 67 (1983) Offsite Electron microscopy and analysis, 1983 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Guildford, 30 August-2 September 1983 (EMAG 83) / edited by P. Doig.
- Text
- Bristol : Institute of Physics, c1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text JSK 77-69 no. 68 v. 68 (1983) Offsite The principles and practice of electron microscopy / Ian M. Watt.
- Text
- Cambridge [Cambridgeshire] ; New York : Cambridge University Press, 1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSF 86-347 Offsite Practical analytical electron microscopy in materials science / David B. Williams.
- Text
- [Weinheim, Basel] : Verlag Chemie International ; [Deerfield Beach, Fla. : Electron Optics Pub. Co.], c1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text JSF 85-1210 Offsite Advanced photon and particle techniques for the characterization of defects in solids : symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A. / editors, J.B. Roberto, R.W. Carpenter, M.C. Wittels.
- Text
- Pittsburgh, Pa. : Materials Research Society, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSE 86-536 Offsite Microscopy of semiconducting materials, 1985 : proceedings of the Royal Microscopical Society conference held in St. Catherine's College, Oxford, 25-27 March 1985 / edited by A.G. Cullis and D.B. Holt.
- Text
- Bristol, England ; Boston : A. Hilger, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSK 77-69 no. 76 v. 76 (1985) Offsite Electron microscopy and analysis, 1985 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Newcastle upon Tyne, 2-5 September 1985 (EMAG 85) / edited by G.J. Tatlock.
- Text
- Bristol ; Boston : A. Hilger, c1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text JSE 87-137 Offsite Electron energy-loss spectroscopy in the electron microscope / R.F. Egerton.
- Text
- New York : Plenum Press, c1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text JSE 87-1668 Offsite Principles of analytical electron microscopy / edited by David C. Joy, Alton D. Romig, Jr., and Joseph I. Goldstein.
- Text
- New York : Plenum Press, c1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text JSE 87-1817 Offsite
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