Research Catalog

  • Backplanes and sockets: a technology and market assessment / prepared by Darling & Alsobrook.

    • Text
    • Los Angeles: Darling & Alsobrook, 1974.
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 79-610Offsite
  • Oscilloscopes : how to use them, how they work / Ian Hickman.

    • Text
    • Oxford ; Boston : Newnes, 1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 96-156Offsite
  • European Convention on Security and Detection : 16-18 May 1995 / organised by the Electronics Division of the Institution of Electrical Engineers with the support of Association for Biometrics ... [et al.] ; venue, Brighton Metropole Hotel, UK.

    • Text
    • London : Institution of Electrical Engineers, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text JSG 96-71Offsite
  • Spacecraft environments interactions [microform] : space radiation and its effects on electronic systems / J.W. Howard, Jr.; D.M. Hardage.

    • Text
    • [Marshall Space Flight Center], Ala. : National Aeronautics and Space Administration, Marshall Space Flight Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
    • 1999
  • High temperature power electronics for space [microform] / Ahmad N. Hammond ... [et al.].

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1991]
    • 1991
  • Thermal analysis of the ultraviolet imager camera and electronics [microform] / prepared by Instrumentation and Space Research Division,Southwest Research Institute.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1991]
    • 1991
  • Multi-channel electronically scanned cryogenic pressure sensor [microform] / inventors, John J. Chapman, Purnell Hopson, Jr., Nancy M.H. Kruse.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995
  • Proceedings of the second Infrared Detector Technology Workshop [microform] : held at Ames Research Center, Moffett Field, California, August 13-14, 1985 / compiled by Craig R. McCreight.

    • Text
    • Moffett Field, Calif. : National Aeronautics and Space Administration, Ames Research Center ; [Springfield, Va. : National Technical Information Service, distributor], 1986.
    • 1986
  • A study of the TCAS II collision avoidance system mounted on a Boeing 737 aircraft [microform] / B. Grandchamp, W.D. Burnside, R.G. Rojas.

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1987]
    • 1987
  • Electrical and Chemical Interactions at Mars Workshop. Part II, Appendix [microform] : proceedings of a workshop held at the NASA Lewis Research Center, Cleveland, Ohio, November 19 and 20, 1991.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va. : National Technical Information Service, distributor], 1993.
    • 1992
  • JTEC panel report on electronic manufacturing and packaging in Japan [microform] / Michael J. Kelly ... [et al.].

    • Text
    • Baltimore, Md. : International Technology Research Institute, Loyola College in Maryland ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995
  • Automatic radiated susceptibility test system for payload equipment [microform] / Hoai T. Ngo, John C. Sturman, Noel B. Sargent.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995
  • Thermal Excitation System for Shearography (TESS) [microform] : final technical report for period 26 April 1995 through 30 April 1996 : technical report 5-33847, contract no. NAS8-38609 / prepared by Matthew D. Lansing, Michael W. Bullock.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
    • 1996
  • Hybrid damping system for an electronic equipment mounting shelf [microform] : final report for NASA-Ames university consortium, joint research interchange, February 1, 1995 - January 31, 1997 / collaborators: David Voracek ... [et al.].

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]
    • 1997
  • "Development of collaborative research initiatives to advance the aerospace sciences [microform] : via the Communications, Electronics, Information Systems Focus Group" : final report ... : cooperative agreement number, NCC3-320 / submitted by Ohio Aerospace Institute ; principal investigator, T. Michael Knasel.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
    • 1996
  • Development of electronics for low-temperature space missions [microform] / Richard L. Patterson ... [et al.].

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; Springfield, VA : National Technical Information Service, distributor, [2001]
    • 2001
  • Personal electronic devices and their interference with aircraft systems [microform] / Elden Ross ; prepared for Langley Research Center under contract NAS1-96014.

    • Text
    • Hampton, VA : NASA Langley Research Center ; Hanover, MD : Available from NASA Center for Aerospace Information, [2001]
    • 2001
  • Environmental projects. Volume 1, Environmental assessment [microform] : addition to operations building, Mars site.

    • Text
    • [Pasadena, Calif.] : Jet Propulsion Laboratory, [1990]
    • 1990
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS69393
  • Rocket engine hot-spot detector [microform] : final report.

    • Text
    • Sacramento, Calif. : Aerojet TechSystems Company ; [Houston, Tex.] : National Aeronautics and Space Administration, Lyndon B. Johnson Space Center, [1985]
    • 1985
  • Total-dose radiation effects data for semiconductor devices [microform] : 1985 supplement, volume 1 / Keith E. Martin ... [et al.].

    • Text
    • Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology, [1985]
    • 1985
  • Thermal enclosures for electronically scanned pressure modules operating in cryogenic environments / Michael Mitchell and Bradley S. Sealey.

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [1989]
    • 1989
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/LPS108748
  • Thermal enclosures for electronically scanned pressure modules operating in cryogenic environments [microform] / Michael Mitchell and Bradley S. Sealey.

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [1989]
    • 1989
  • Modular instrumentation system for real-time measurements and control on reciprocating engines / William J. Rice and Arthur G. Birchenough.

    • Text
    • [Washington, D.C.] : National Aeronautics and Space Administration, Scientific and Technical Information Branch, November 1980.
    • 1980-11
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo71185
  • FIM avionics operations manual / Erin E. Alves.

    • Text
    • Hampton, Virginia : National Aeronautics and Space Administration, Langley Research Center, March 2017.
    • 2017-3
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo81369
  • Oscilloscopes : how to use them, how they work / Ian Hickman.

    • Text
    • Oxford ; Boston : Newnes, 1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text TK7878.7 .H53 1995Off-site
  • Electronics engineer's reference book / edited by F.F. Mazda ; with specialist contributors.

    • Text
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Text TK7825 .E54 1983Off-site
  • In-circuit testing / John Bateson.

    • Text
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text TK7868.P7 B37 1985Off-site
  • Electronics for neurobiologists [by] Paul B. Brown, Bruce W. Maxfield [and] Howard Moraff.

    • Text
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text TK7816 .B81 1973Off-site
  • Nanoelectronics and information technology : advanced electronic materials and novel devices / Rainer Waser (ed.)

    • Text
    • Weinheim : Wiley-VCH, c2003.
    • 2003
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871 .N36 2003Off-site
  • Electronics: circuits and devices [by] Ralph J. Smith.

    • Text
    • New York, Wiley [1973]
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text TK7816.S6Off-site
  • Electronic engineering materials and devices.

    • Text
    • London, New York, McGraw-Hill [1971]
    • 1971
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.A44Off-site
  • Microelectronics : theory, design, and fabrication / edited by Edward Keonjian, foreword by Jack A. Morton.

    • Text
    • New York, McGraw-Hill [1963]
    • 1963
    • 1 Item
    FormatCall NumberItem Location
    Text 9295.519.2Off-site
  • Pulse techniques, by Sidney Moskowitz and Joseph Racker.

    • Text
    • New York, Prentice-Hall, 1951.
    • 1951
    • 1 Item
    FormatCall NumberItem Location
    Text 92951.655Off-site

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