Research Catalog
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Displaying 1-2 of 2 results
Structural and chemical analysis of materials : X-ray, electron and neutron diffraction ; X-ray, electron and ion spectrometry ; electron microscopy / J.P. Eberhart ; translated by J.P. Eberhart.
- Text
- Chichester, West Sussex, England ; New York : Wiley, ©1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text TA417.23 .E2413 1991 Off-site Not available - Please for assistance.Scanning tunneling microscopy and spectroscopy : theory, techniques, and applications / editor, Dawn A. Bonnell.
- Text
- New York, N.Y. : VCH, ©1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text QH212.S35 S365 1993 Off-site Not available - Please for assistance.
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