Research Catalog
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The optimal polarizations for achieving maximum contrast in radar images [microform] / A.A. Swartz ... [et al.].
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1988]
- 1988
Advancement of X-ray microscopy technology and its application to metal solidification studies [microform] / William F. Kaukler, Peter A. Curreri.
- Text
- [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
- 1996
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