Research Catalog

  • Interferometry as a measuring tool, by J. Dyson.

    • Text
    • Brighton, Machinery Publishing, 1970.
    • 1970
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 73-511Offsite
  • An introduction to interferometry [by] S. Tolansky. 2d ed.

    • Text
    • New York, Wiley [1973]
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 73-1556Offsite
  • Interferometrie in Radioastronomie und Radartechnik/ Wohlleben-Mattes. -

    • Text
    • Würzburg: Vogel-Verlag, 1973.
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 75-11Offsite
  • The intensity interferometer; its application to astronomy [by] R. Hanbury Brown.

    • Text
    • London, Taylor & Francis; New York, Halsted Press, 1974.
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 75-586Offsite
  • New methods to simplify engineering uses of visual interferometric inspection [microform] by Nils H. Abramson.

    • Text
    • Stockholm, 1970.
    • 1970
  • Analiz i sintez mnogosloĭnykh interferen︠t︡sionnykh plenok.

    • Text
    • Tallin, "Valgus," 1971.
    • 1971
    • 1 Item
    FormatCall NumberItem Location
    Text *QH 75-1851Offsite
  • The Engineering uses of coherent optics : proceedings and edited discussion of a conference held at the University of Strathclyde, Glasgow 8-11 April, 1975 / organised by the University, in association with the International Commission for Optics, The Institute of Physics, the Institution of Mechanical Engineers ; edited by Elliot R. Robertson.

    • Text
    • Cambridge [Eng.] ; New York : Cambridge University Press, 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 77-237Offsite
  • A preliminary investigation into the visualization of gas layers.

    • Text
    • [Borehamwood, Herts] Fire Research Station, 1972.
    • 1972
    • 1 Item
    FormatCall NumberItem Location
    Text JSK 75-368Offsite
  • Optical shop testing / edited by Daniel Malacara.

    • Text
    • New York : Wiley, c1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 78-1332Offsite
  • Holographic interferometry / Charles V. West.

    • Text
    • New York : Wiley, c1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 79-693Offsite
  • High angular resolution stellar interferometry : the proceedings of Colloquium No. 50, International Astronomical Union, held at the University of Maryland, College Park, Maryland, U.S.A., 30 August-1 September, l978 / edited by John Davis and William, J. Tango.

    • Text
    • [Sydney] : Chatterton Astronomy Dept., School of Physics, University of Sydney, 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 82-334Offsite
  • Optics in biomedical sciences : proceedings of the Internatinal Conference, Graz, Austria, September 7-11, 1981 / editors, G. von Bally and P. Greguss.

    • Text
    • Berlin New York : Springer-Verlag, 1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 83-141Offsite
  • Fabry-Perot interferometers / G. Hernandez.

    • Text
    • Cambridge [Cambridgeshire] ; New York : Cambridge University Press, 1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 88-1076Offsite
  • Les progrès récents en spectroscopie interférentielle, Bellevue, 9 septembre-13 septembre 1957.

    • Text
    • Paris, 1958.
    • 1958
    • 1 Item
    FormatCall NumberItem Location
    Text PET (France. Recherche scientifique, Centre national de la. Progres recents en spectroscopie interferentielle) 1958Offsite
  • High resolution spectroscopy, by S. Tolansky ... With 4 plates and 119 diagrams.

    • Text
    • London, Methuen & Co. ltd. [1947]
    • 1947
    • 1 Item
    FormatCall NumberItem Location
    Text PET (Tolansky, S. High resolution spectroscopy)Offsite
  • Multiple-beam interferometry of surfaces and films.

    • Text
    • Oxford, Clarendon Press, 1948.
    • 1948
    • 1 Item
    FormatCall NumberItem Location
    Text PET (Tolansky, S. Multiple-beam interferometry)Offsite
  • Modern interferometers.

    • Text
    • [London] Hilger & Watts, 1951.
    • 1951
    • 1 Item
    FormatCall NumberItem Location
    Text PED (Candler, A. C. Modern interferometers) 1951Offsite
  • Diffraction gratings as measuring scales; practical guide to the metrological use of moiré fringes.

    • Text
    • London, New York, Oxford University Press, 1960.
    • 1960
    • 1 Item
    FormatCall NumberItem Location
    Text PEK (Guild, J. Diffraction gratings as measuring scales) 1960Offsite
  • Applications of interferometry; with a preface by O. W. Richardson; with 43 diagrams.

    • Text
    • London, Methuen & Co., ltd. [1930]
    • 1930
    • 1 Item
    FormatCall NumberItem Location
    Text PEK (Williams, W. E. Applications of interferometry. 1930) 1930Offsite
  • Applications of interferometry, by W. Ewart Williams. With a preface by O.W. Richardson.

    • Text
    • London, Methuen; New York, Wiley [1950]
    • 1950
    • 1 Item
    FormatCall NumberItem Location
    Text PEK (Williams, W. E. Applications of interferometry. 1950) 1950Offsite
  • The microstructures of diamond surfaces.

    • Text
    • London, N.A.G. Press [1955]
    • 1955
    • 1 Item
    FormatCall NumberItem Location
    Text PWW (Tolansky, S. Microstructures of diamond surfaces)Offsite
  • Interferogram analysis for optical testing / Daniel Malacara, Manuel Servín, Zacarias Malacara.

    • Text
    • New York : Marcel Dekker, c1998.
    • 1998
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 98-1189Offsite
  • The absorption of ultrasonic waves in liquids, by Arthur Lincoln Quirk.

    • Text
    • Washington, D.C., The Catholic University of America, 1934.
    • 1934
    • 1 Item
    FormatCall NumberItem Location
    Text PAH p.v. 120 no. 1-5Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Méthodes interférométriques d'étude des mouvements de l'air.

    • Text
    • Paris : Éditions de la Revue d'optique théorique et instrumentale, 1934.
    • 1934
    • 1 Item
    FormatCall NumberItem Location
    Text PAH p.v. 131 no. 1-6Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Application of the interferometer to gas analysis, by Junius David Edwards, Associate Chemist, Bureau of Standards. Issued October 6, 1919 ...

    • Text
    • Washington, Govt. Print. Off., 1919.
    • 1919
    • 1 Item
    FormatCall NumberItem Location
    Text VHBD p.v. 12 no. 1-8Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Introducción a la interferometría.

    • Text
    • [Madrid] 1949.
    • 1949
    • 1 Item
    FormatCall NumberItem Location
    Text *ES M751 (Monografias de ciencia moderna. no. 15-16) no. 16-19Offsite
  • WAMDII [microform] : The Wide Angle Michelson Doppler Imaging Interferometer.

    • Text
    • [Washington, DC] : NASA/National Research Council of Canada/WAMDII Science Team, [1992]
    • 1992
  • 2D velocity and temperature measurements in high speed flows based on spectrally resolved Rayleigh scattering [microform] / Richard G. Seasholtz.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1992]
    • 1992
  • Development of an optical fiber interferometer for detection of surface flaws in aluminum [microform] / prepared by John A. Gilbert.

    • Text
    • Huntsville, Ala. : George C. Marshall Space Flight Center, National Aeronatics and Space Administration, [1991]
    • 1991
  • Equal path, phase shifting, sample point interferometer for monitoring the configuration of surfaces [microform] / inventor, Paul K. Manhart.

    • Text
    • [Pasadena, CA] : Jet Propulsion Laboratory ; [Springfield, Va. : National Technical Information Center, distributor, 1990]
    • 1990
  • Multiorder etalon sounder (MOES), development and test for balloon experiment [microform] : final technical report / Paul B. Hayes, Jinxue Wnag [i.e. Wang], Jian Wu.

    • Text
    • Ann Arbor, Mich. : University of Michigan, Dept. of Atmospheric, Oceanic and Space Science, Space Physics Research Laboratory ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1993]
    • 1993
  • Performance analysis of an integrated GPS/inertial attitude determination system [microform] / by Wendy I. Sullivan.

    • Text
    • Cambridge, MA : Charles Stark Draper Laboratory ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]
    • 1994
  • Ultraviolet-infrared mapping interferometric spectrometer [microform] : final report for UMIS.

    • Text
    • [Saint Louis, Mo. : Washington Univ. ; Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]
    • 1994
  • Optical fiber sensors for the non-destructive evaluation of materials [microform] : final report, January-December 1986 / prepared by Fiber and Electrooptics Research Center, Dept. of Electrical Engineering, Virginia Tech.

    • Text
    • Blacksburg, Va. : Virginia Polytechnic Institute and State University : [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1987]
    • 1987
  • Stellar interferometer technology experiment (SITE) [microform] / principal investigator, Edward F. Crowley.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995
  • A phase-stepped point diffraction interferometer using liquid crystals [microform] / Carolyn R. Mercer, Katherine Creath, Nasser Rashidnia.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995
  • Liquid crystal point diffraction interferometer [microform] / Carolyn Regan Mercer.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995
  • The relationship of storm severity to directionally resolved radio emissions [microform] : final report / by R.L. Johnson.

    • Text
    • San Antonio, Tex. : Southwest Research Institute ; [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1986]
    • 1986
  • Feasibility study of optical boundary layer transition detection method [microform] / M. Azzazy, D. Modarress, and J.D. Trolinger.

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : For sale by the National Technical Information Service, 1986]
    • 1986
  • A Lunar Optical-Ultraviolet-Infrared Synthesis Array (LOUISA) [microform] : proceedings of a workshop sponsored by the National Aeronautics and Space Administration, and held at the University of New Mexico, Albuquerque, New Mexico, February 8-10, 1989 / edited by Jack O. Burns, Stewart W. Johnson, Nebojsa Duric.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va. : National Technical Information Service, distributor], 1992.
    • 1992
  • Robust quantitative measurement of flows and transparent or highly reflective objects [microform] / Carolyn R. Mercer and Nasser Rashidnia.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995
  • Performance assessment of the Digital Array Scanned Interferometer (DASI) concept [microform] / Stephen J. Katzberg, Richard B. Statham.

    • Text
    • Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1996]
    • 1996
  • Nocturnal observations of the semidiurnal tide at a midlatitude site [microform] / R.J. Niciejewski and T.L. Killeen.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995
  • High data density temperature measurement for quasi steady-state flows [microform] / Carolyn R. Mercer, Nasser Rashidnia, Katherine Creath.

    • Text
    • [Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995
  • Analysis of measurements for solid state lidar development [microform] : contract no. NAS8-38609 ... contract period: August 8, 1994 - December 7, 1995 / prepared by Farzin Amzajerdian.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
    • 1996
  • Timed Doppler Interferometer, TIDI [microform] : TIDI CoDR review meeting, Oct. 31 - Nov. 1, 1995 / [principal investigator, Timothy L. Killeen].

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995]
    • 1995
  • A comparison of structurally connected and multiple spacecraft interferometers [microform] / Derek M. Surka and Edward F. Crawley.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
    • 1996
  • Novel diffusivity measurement technique [microform] / Nasser Rashidnia ; prepared under cooperative agreement NCC3-544.

    • Text
    • [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; Hanover, MD : Available from NASA Center for Aerospace Information, [2001]
    • 2001
  • MEMS length and strain measurements using an optical interferometer [microform] / J.C. Marshall.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2001]
    • 2001
  • Interferometer control of optimal tweezers [microform] / Arthur J. Decker.

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center ; Hanover MD : Available from NASA Center for AeroSpace Information, [2002]
    • 2002
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS36280

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