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The measurement of intelligence; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale, by Lewis M. Terman ...
- Text
- Boston, New York Houghton Mifflin Company [©1916]
- 1916
- 1 Item
Item details Format Call Number Item Location Text LB1131 .T476 1916 Off-site Mental tests; their history, principles and applications, by Frank N. Freeman ...
- Text
- Boston, New York Houghton Mifflin Company [©1926]
- 1926
- 1 Item
Item details Format Call Number Item Location Text 64941.361 Off-site The maze test and mental differences / by Stanley D. Porteus ...
- Text
- Vineland, N.J. : Smith printing and Publishing House, 1933.
- 1933
- 1 Item
Item details Format Call Number Item Location Text BF433.M3 P6 1933 Off-site The Stanford revision and extension of the Binet-Simon scale for measuring intelligence / by Lewis M. Terman, Grace Lyman, George Ordahl, Louise Ellison Ordahl, Neva Galbreath and Wilford Talbert ; assisted by Herbert E. Knollin [and 6 others].
- Text
- Baltimore : Warwick & York, Inc., 1917.
- 1917
- 1 Item
Item details Format Call Number Item Location Text LB1131 .T476 1917 Off-site A scale of performance tests, by Rudolf Pintner and Donald G. Paterson.
- Text
- New York, London, D. Appleton and Company, ©1917.
- 1917
- 1 Item
Item details Format Call Number Item Location Text LB1131 .P6 1917 Off-site
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