Research Catalog

  • The measurement of intelligence; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale, by Lewis M. Terman ...

    • Text
    • Boston, New York Houghton Mifflin Company [©1916]
    • 1916
    • 1 Item
    FormatCall NumberItem Location
    Text LB1131 .T476 1916Off-site
  • Mental tests; their history, principles and applications, by Frank N. Freeman ...

    • Text
    • Boston, New York Houghton Mifflin Company [©1926]
    • 1926
    • 1 Item
    FormatCall NumberItem Location
    Text 64941.361Off-site
  • The maze test and mental differences / by Stanley D. Porteus ...

    • Text
    • Vineland, N.J. : Smith printing and Publishing House, 1933.
    • 1933
    • 1 Item
    FormatCall NumberItem Location
    Text BF433.M3 P6 1933Off-site
  • The Stanford revision and extension of the Binet-Simon scale for measuring intelligence / by Lewis M. Terman, Grace Lyman, George Ordahl, Louise Ellison Ordahl, Neva Galbreath and Wilford Talbert ; assisted by Herbert E. Knollin [and 6 others].

    • Text
    • Baltimore : Warwick & York, Inc., 1917.
    • 1917
    • 1 Item
    FormatCall NumberItem Location
    Text LB1131 .T476 1917Off-site
  • A scale of performance tests, by Rudolf Pintner and Donald G. Paterson.

    • Text
    • New York, London, D. Appleton and Company, ©1917.
    • 1917
    • 1 Item
    FormatCall NumberItem Location
    Text LB1131 .P6 1917Off-site

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