Research Catalog

  • A computer software package for statisticsl [sic] pattern recognition / by Chi-hau Chen, Maisie Fan.

    • Text
    • North Dartmouth, Mass. : Southeastern Massachusetts University, Electrical Engineering Dept., [1974]
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 85-252Offsite
  • Colloque international sur la reconnaissance de forme. International Conference on "Pattern Recognition," Grenoble 11-13 septembre 1968 ...

    • Text
    • [Grenoble?] Laboratoire d'électronique et de technologie de l'informatique, 1969.
    • 1969
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 71-146Offsite
  • Pattern recognition; proceedings. Edited by Laveen N. Kanal.

    • Text
    • Washington, Thompson Book Co., 1968.
    • 1968
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 72-744Offsite
  • Introduction to mathematical techniques in pattern recognition [by] Harry C. Andrews.

    • Text
    • New York, Wiley-Interscience [1972]
    • 1972
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 73-188Offsite
  • Pattern apprehension: the development of international representations. [By] Abram R. W. Muijen.

    • Text
    • Amsterdam, Swets & Zeitlinger, 1972.
    • 1972
    • 1 Item
    FormatCall NumberItem Location
    Text JFE 73-851Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Pattern recognition: introduction and foundations.

    • Text
    • Stroudsburg, Pa., Dowden, Hutchinson & Ross [1973]
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 74-185Offsite
  • Psychological processes in pattern recognition [by] Stephen K. Reed.

    • Text
    • New York, Academic Press, 1973.
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text JFE 74-1805Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Methodologies of pattern recognition; [proceedings] Edited by Satosi Watanabe.

    • Text
    • New York, Academic Press, 1969.
    • 1969
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 74-1297Offsite
  • Syntactic methods in pattern recognition [by] K. S. Fu.

    • Text
    • New York, Academic Press, 1974.
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 75-239Offsite
  • Pattern recognition principles [by] Julius T. Tou [and] Rafael C. Gonzalez.

    • Text
    • Reading, Mass., Addison-Wesley Pub. Co., 1974.
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 75-664Offsite
  • Chemical applications of pattern recognition / Peter C. Jurs, Thomas L. Isenhour.

    • Text
    • New York : Wiley, [1975]
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 75-772Offsite
  • Patterns and configurations in economic science, by J. M. Blin.

    • Text
    • Dordrecht, Holland, Boston, D. Reidel Pub. Co. [1973]
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Text JLD 75-1878Offsite
  • Recognition of patterns using the frequencies of occurrence of binary words [by] Peter W. Becker. 2d rev. ed.

    • Text
    • Wien, New York, Springer-Verlag [1974]
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 75-1070Offsite
  • Raspoznavanie obrazov.

    • Text
    • Riga, Izd-vo "Zinatne", 1974-
    • 1974-19
    • 2 Items
    FormatCall NumberItem Location
    Text *QHA 75-948 v. 1Offsite
    FormatCall NumberItem Location
    Text *QHA 75-948 v. 2Offsite
  • Classification, estimation, and pattern recognition [by] Tzay Y. Young [and] Thomas W. Calvert.

    • Text
    • New York, American Elsevier Pub. Co. [1974]
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 75-1251Offsite
  • Practical approach to pattern classification / Bruce G. Batchelor.

    • Text
    • London ; New York : Plenum Press, 1974.
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 77-26Offsite
  • Methoden der Mustererkennung.

    • Text
    • Frankfurt am Main, Akademische Verlagsgesellschaft, 1974.
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 76-868Offsite
  • Fuzzy sets and their applications to cognitive and decision processes : [papers] / edited by Lofti A. Zadeh ... [et al.].

    • Text
    • New York : Academic Press, 1975.
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 76-206Offsite
  • Digital pattern recognition / edited by K. S. Fu ; with contributions by T. M. Cover ... [et al.].

    • Text
    • Berlin ; New York : Springer-Verlag, 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 76-799Offsite
  • Syntactic pattern recognition : applications / edited by K. S. Fu ; with contributions by J. E. Albus ... [et al.].

    • Text
    • Berlin ; New York : Springer-Verlag, 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 77-677Offsite
  • Proceedings.

    • Text
    • Long Beach, Calif., Institue of Electrical and Electronics Engineers.
    • 1973-1978
    • 4 Items
    FormatCall NumberItem Location
    Text JSP 77-531 v. 2 (1974)Offsite
    FormatCall NumberItem Location
    Text JSP 77-531 v. 3 (1976)Offsite
    FormatCall NumberItem Location
    Text JSP 77-531 v. 4 (1978)Offsite
  • Conference record / 1976 Joint Workshop on Pattern Recognition and Artifical Intelligence, held at Hyannis, Massachusetts, June 1-3, 1976 ; sponsored by IEEE Computer Society.

    • Text
    • Long Beach, CA : The Society, c1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 78-98Offsite
  • Pattern recognition theory and application : [proceedings of the NATO Advanced Study Institute on Pattern Recognition-Theory and Application, Bandol, France, September 1975] / edited by K. S. Fu and A. B. Whinston.

    • Text
    • Leyden : Noordhoff, 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text JSK 75-267 no. 22 v. 22Offsite
  • Syntactic pattern recognition : an introduction / Rafael C. Gonzalez, Michael G. Thomason.

    • Text
    • Reading, Mass. : Addison-Wesley Pub. Co., Advanced Book Program, 1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 79-287Offsite
  • Pattern recognition : ideas in practice / edited by Bruce G. Batchelor.

    • Text
    • New York : Plenum Press, c1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 79-360Offsite
  • Polynomklassifikatoren für die Zeichenerkennung : Ansatz, Adaption, Anwendungen / von Jürgen Schürmann. 1. Aufl.

    • Text
    • München ; Wien : Oldenbourg, 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 79-711Offsite
  • Proceedings, PRIP78, May 31-June 2, 1978, Chicago, Illinois : IEEE Computer Society Conference on Pattern Recognition and Image Processing.

    • Text
    • Long Beach, Calif. : IEEE Computer Society, c1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 79-841Offsite
  • IEEE transactions on pattern analysis and machine intelligence.

    • Text
    • [New York] IEEE Computer Society.
    • 1979-present
    • 51 Items
    FormatCall NumberItem Location
    Text JSP 85-603 v. 30, no. 2 (Feb 2008)Offsite
    FormatCall NumberItem Location
    Text JSP 85-603 v. 30, no. 3 (Mar 2008)Offsite
    FormatCall NumberItem Location
    Text JSP 85-603 v. 30, no. 4 (Apr 2008)Offsite
  • Structural pattern recognition / T. Pavlidis.

    • Text
    • Berlin ; New York : Springer-Verlag, 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 80-158Offsite
  • Pattern formation by dynamic systems and pattern recognition : proceedings of the International Symposium on Synergetics at Schloss Elmau, Bavaria / editor, H. Haken.

    • Text
    • Berlin ; New York : Springer-Verlag, 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 81-1024Offsite
  • Grundlagen der technischen Erkennung / Rolf Peipmann. 1. Aufl.

    • Text
    • Berlin : Verlag Technik, 1975.
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 81-110Offsite
  • Reconnaissance des formes et intelligence artificielle : 2. congrès AFCET-IRIA, Toulouse, 12, 13 14 septembre 1979 / [édité par l'Institut de recherche d'informatique et d'automatique].

    • Text
    • Rocquencourt : Institut de recherche d'informatique et d'automatique, 1979.
    • 1979
    • 2 Items
    FormatCall NumberItem Location
    Text JSE 82-258 v. 1Offsite
    FormatCall NumberItem Location
    Text JSE 82-258 v. 2-3Offsite
  • Pattern recognition theory and applications : proceedings of the NATO Advanced Study Institute held at St. Anne's College, Oxford, March 29-April 10, 1981 / edited by J. Kittler, K.S. Fu, and L.F. Pau.

    • Text
    • Dordrecht, Holland ; Boston : D. Reidel ; Hingham, MA : Sold and distributed in the U.S.A. and Canada by Kluwer Boston, c1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 82-436Offsite
  • Pattern recognition with fuzzy objective function algorithms / James C. Bezdek.

    • Text
    • New York : Plenum Press, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 81-1646Offsite
  • Pattern recognition : a statistical approach / Pierre A. Devijver and Josef Kittler.

    • Text
    • Englewood Cliffs, N.J. : Prentice/Hall International, c1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 83-337Offsite
  • Proceedings / International Conference on Pattern Recognition.

    • Text
    • [New York] : Institute of Electrical and Electronics Engineers, c1980-
    • 1980-present
    • 11 Items
    FormatCall NumberItem Location
    Text JSP 83-31 1994:v. 1 Offsite
    FormatCall NumberItem Location
    Text JSP 83-31 1994:v. 2 Offsite
    FormatCall NumberItem Location
    Text JSP 83-31 1994:v. 3 Offsite
  • Proceedings / IEEE Computer Society Conference on Pattern Recognition and Image Processing.

    • Text
    • New York : Institute of Electrical and Electronics Engineers, 1977-1982.
    • 1977-1982
    • 3 Items
    FormatCall NumberItem Location
    Text JSP 83-203 1982Offsite
    FormatCall NumberItem Location
    Text JSP 83-203 1981Offsite
    FormatCall NumberItem Location
    Text JSP 83-203 1979Offsite
  • Proceedings : CVPR / IEEE Computer Society Conference on Computer Vision and Pattern Recognition.

    • Text
    • Silver Spring, Md. : IEEE Computer Society Press, 1983-
    • 1983-present
    • 21 Items
    FormatCall NumberItem Location
    Text JSP 83-204 v. 2 (2003)Offsite
    FormatCall NumberItem Location
    Text JSP 83-204 v. 2 (2004)Offsite
    FormatCall NumberItem Location
    Text JSP 83-204 v. 2 (2005)Offsite
  • Learning systems : decision, simulation, and control / Yousri M. El-Fattah, Claude Foulard.

    • Text
    • Berlin ; New York : Springer-Verlag, 1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 84-622Offsite
  • Fuzzy mathematical approach to pattern recognition / Sankar K. Pal, Dwijesh K. Dutta Majumder.

    • Text
    • New York : Wiley, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 88-1776Offsite
  • Structural methods in pattern recognition / by Laurent Miclet ; translated by J. Howlett.

    • Text
    • New York : Springer-Verlag, 1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 87-1445Offsite
  • Artificial intelligence with statistical pattern recognition / Edward A. Patrick, James M. Fattu.

    • Text
    • Englewood Cliffs, N.J. : Prentice-Hall, Business and Professional Division, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 86-1801Offsite
  • Subspace methods of pattern recognition / E. Oja.

    • Text
    • Letchworth, Hertfordshire, England : Research Studies Press ; New York : Wiley, c1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 86-1752Offsite
  • Knowledge as design / D.N. Perkins.

    • Text
    • Hillsdale, N.J. : L. Erlbaum Associates, 1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JFE 86-5116Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Temporal-pattern learning in neural models / Carme Torras i Genís.

    • Text
    • Berlin ; New York : Springer-Verlag, c1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text JSK 75-186 v. 62-64Offsite
  • Pattern recognition mechanisms : proceedings of a Study Week / organized by The Pontifical Academy of Sciences, Casina Pius IV, Vatican City ; edited by Carlos Chagas, Ricardo Gattass, Charles Gross.

    • Text
    • Berlin ; New York : Springer-Verlag, 1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Text JSD 87-261Offsite
  • Pattern recognition by humans and machines / [edited] by Eileen C. Schwab, Howard C. Nusbaum.

    • Text
    • Orlanda, Fla. : Academic Press, 1986.
    • 1986
    • 2 Items
    FormatCall NumberItem Location
    Text JFE 87-3826 v. 2Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

    FormatCall NumberItem Location
    Text JFE 87-3826Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Science on form : proceedings of the First International Symposium for Science on Form, University of Tsukuba, Japan, November 26-30, 1985 / general editor, S. Ishizaka ; editors, Y. Kato, R. Takaki, and J. Toriwaki.

    • Text
    • Tokyo : KTK Scientific Publishers ; Dordrecht ; Boston : D. Reidel ; Norwell, MA, U.S.A. : Sold and distributed in the U.S.A. and Canada by Kluwer Academic Publishers, c1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 87-2541Offsite
  • Reconnaissance des formes et intelligence artificielle : 4ème congrès, Paris, 25-27 janvier 1984 / AFCET, Agence de l'informatique, INRIA.

    • Text
    • Paris : AFCET, [1984 or 1985]
    • 1984
    • 2 Items
    FormatCall NumberItem Location
    Text JSE 87-2497 v. 1Offsite
    FormatCall NumberItem Location
    Text JSE 87-2497 v. 2Offsite
  • Potential pattern recognition in chemical and medical decision making / D. Coomans, I. Broeckaert.

    • Text
    • Letchworth, Hertfordshire, England : Research Studies Press ; New York : Wiley, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 87-2152Offsite

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