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Displaying 1-50 of 562 results
A computer software package for statisticsl [sic] pattern recognition / by Chi-hau Chen, Maisie Fan.
- Text
- North Dartmouth, Mass. : Southeastern Massachusetts University, Electrical Engineering Dept., [1974]
- 1974
- 1 Item
Item details Format Call Number Item Location Text JSF 85-252 Offsite Pattern recognition principles [by] Julius T. Tou [and] Rafael C. Gonzalez.
- Text
- Reading, Mass., Addison-Wesley Pub. Co., 1974.
- 1974
- 1 Item
Item details Format Call Number Item Location Text JSE 75-664 Offsite Practical approach to pattern classification / Bruce G. Batchelor.
- Text
- London ; New York : Plenum Press, 1974.
- 1974
- 1 Item
Item details Format Call Number Item Location Text JSE 77-26 Offsite Proceedings of the Conference on Computer Graphics, Pattern Recognition, & Data Structure, May 14-16, 1975 / sponsored by UCLA Extension in participation with the IEEE Computer Society and in cooperation with the ACM Special Interest Group on Computer Graphics.
- Text
- [New York : Institute of Electrical and Electronics Engineers, 1975]
- 1975
- 1 Item
Item details Format Call Number Item Location Text JSF 77-150 Offsite Syntactic pattern recognition : applications / edited by K. S. Fu ; with contributions by J. E. Albus ... [et al.].
- Text
- Berlin ; New York : Springer-Verlag, 1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Text JSE 77-677 Offsite Data structures, computer graphics, and pattern recognition / edited by A. Klinger, K. S. Fu, T. L. Kunii.
- Text
- New York : Academic Press, 1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Text JSE 78-50 Offsite Pattern recognition and artificial intelligence : proceedings of the Joint Workshop on Pattern Recognition and Artificial Intelligence, held at Hyannis, Massachusetts, June 1-3, 1976 / edited by C. H. Chen.
- Text
- New York : Academic Press, 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text JSE 78-422 Offsite Interactive pattern recognition / Yi-Tzuu Chien.
- Text
- New York : M. Dekker, c1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text JSE 78-719 Offsite Lernende Algorithmen und Systeme / hrsg. von Friedhart Klix, Ulrich Rösler u. Hubert Sydow.
- Text
- Berlin : Deutscher Verlag der Wissenschaften, VEB, 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Text JSD 78-559 Offsite Pattern recognition theory and application : [proceedings of the NATO Advanced Study Institute on Pattern Recognition-Theory and Application, Bandol, France, September 1975] / edited by K. S. Fu and A. B. Whinston.
- Text
- Leyden : Noordhoff, 1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Text JSK 75-267 no. 22 v. 22 Offsite Artificial intelligence and pattern recognition in computer aided design : proceedings of the IFIP Working Conference, organized by Working Group 5.2, Computer-aided Design, Grenoble, France, March 17-19, 1978 / edited by Jean-Claude Latombe.
- Text
- Amsterdam ; New York : North-Holland Pub. Co., 1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text JSD 79-548 Offsite Pattern recognition and signal processing / edited by C. H. Chen.
- Text
- Alphen aan den Rijn : Sijthoff & Noordhoff, 1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Text JSK 75-267 no. 29 v. 29 Offsite IEEE transactions on pattern analysis and machine intelligence.
- Text
- [New York] IEEE Computer Society.
- 1979-present
- 51 Items
Item details Format Call Number Item Location Text JSP 85-603 v. 30, no. 2 (Feb 2008) Offsite Item details Format Call Number Item Location Text JSP 85-603 v. 30, no. 3 (Mar 2008) Offsite Item details Format Call Number Item Location Text JSP 85-603 v. 30, no. 4 (Apr 2008) Offsite Algorithms for graphics and image processing / Theo Pavlidis.
- Text
- Rockville, MD : Computer Science Press, c1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text JSE 82-401 Offsite Failure diagnosis and performance monitoring / L.F. Pau.
- Text
- New York : M. Dekker, c1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text JSE 81-1216 Offsite 1981 IEEE Computer Society Workshop on Computer Architecture for Pattern Analysis and Image Database Management, Hot Springs, Virginia, November 11-13, 1981.
- Text
- [Los Angeles, CA] : IEEE Computer Society Press : Order from IEEE Computer Society ; Piscataway, N.J. : Order from IEEE Service Center, c1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Text JSF 82-66 Offsite Proceedings / IEEE Computer Society Conference on Pattern Recognition and Image Processing.
- Text
- New York : Institute of Electrical and Electronics Engineers, 1977-1982.
- 1977-1982
- 3 Items
Item details Format Call Number Item Location Text JSP 83-203 1982 Offsite Item details Format Call Number Item Location Text JSP 83-203 1981 Offsite Item details Format Call Number Item Location Text JSP 83-203 1979 Offsite Proceedings : CVPR / IEEE Computer Society Conference on Computer Vision and Pattern Recognition.
- Text
- Silver Spring, Md. : IEEE Computer Society Press, 1983-
- 1983-present
- 21 Items
Item details Format Call Number Item Location Text JSP 83-204 v. 2 (2003) Offsite Item details Format Call Number Item Location Text JSP 83-204 v. 2 (2004) Offsite Item details Format Call Number Item Location Text JSP 83-204 v. 2 (2005) Offsite 1983 IEEE Computer Society Workshop on Computer Architecture for Pattern Analysis and Image Database Management, Pasadena, California, October 12-14, 1983.
- Text
- Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, Calif. : Order from IEEE Computer Society ; Piscataway, N.J. : Order from IEEE Service Center, c1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSF 84-147 Offsite Recent developments in pattern recognition and digital techniques : selected papers of the all India interdisciplinary symposium, February 15-17, 1977, Calcutta / editor, D. Dutta Majumder, associate editors, N.R. Ganguli ... [et al.] ; organised by Electronics and Communication Sciences Unit, Indian Statistical Institute.
- Text
- Calcutta : Electronics and Communication Sciences Unit, Indian Statistical Institute, [1977?]
- 1977
- 1 Item
Item details Format Call Number Item Location Text JSE 83-906 Offsite Machine perception / Ramakant Nevatia.
- Text
- Englewood Cliffs, N.J. : Prentice-Hall, c1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Text JSE 83-637 Offsite Pattern models / Narendra Ahuja, Bruce J. Schachter.
- Text
- New York : Wiley, c1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSE 84-1023 Offsite VLSI for pattern recognition and image processing / editor, King-sun Fu.
- Text
- Berlin ; New York : Springer-Verlag, 1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text JSE 85-966 Offsite Pictorial data analysis / edited by Robert M. Haralick.
- Text
- Berlin ; New York : Springer-Verlag, 1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSE 85-300 Offsite Handbook of pattern recognition and image processing / edited by Tzay Y. Young, King-Sun Fu.
- Text
- Orlando : Academic Press, 1986-1994.
- 1986-1994
- 2 Items
Item details Format Call Number Item Location Text JSL 95-203 v. 1 Offsite Item details Format Call Number Item Location Text JSL 95-203 v. 2 Offsite Pattern recognition : applications to large data-set problems / Sing-Tze Bow.
- Text
- New York : M. Dekker, c1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Text JSE 86-498 Offsite Learning systems and pattern recognition in industrial control : applying artificial intelligence to industrial control : proceedings of the Ninth Annual Advanced Control Conference, West Lafayette, Indiana, September 19-21, 1983 / sponsored by Control Engineering and the Purdue Laboratory for Applied Industrial Control ; E.J. Kompass and T.J. Williams, editors.
- Text
- Barrington, IL : Control Engineering, c1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Text JSF 86-423 Offsite Model-based image matching using location / Henry S. Baird.
- Text
- Cambridge, Mass. : MIT Press, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSE 86-2160 Offsite 1985 IEEE Computer Society Workshop on Computer Architecture for Pattern Analysis and Image Database Management, Miami Beach, Florida, November 18-20, 1985.
- Text
- Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSF 86-810 Offsite Mustererkennung--Medizin, Sprachanalyse, Rechnerarchitektur / herausgegeben von E. Schuster.
- Text
- Wien : R. Oldenbourg, 1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSD 87-417 Offsite Pattern recognition problems in geology and paleontology / Ulf Bayer.
- Text
- Berlin ; New York : Springer-Verlag, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Text JSE 86-1363 Offsite Applications of artificial intelligence in engineering problems : proceedings of the 1st international conference, Southampton University, U.K., April 1986 / editors, D. Sriram, R. Adey.
- Text
- Berlin ; New York : Springer-Verlag ; Southampton [Hampshire] : Computational Mechanics, c1986.
- 1986
- 2 Items
Item details Format Call Number Item Location Text JSE 87-638 v. 1 Offsite Item details Format Call Number Item Location Text JSE 87-638 v. 2 Offsite Pattern recognition by humans and machines / [edited] by Eileen C. Schwab, Howard C. Nusbaum.
- Text
- Orlanda, Fla. : Academic Press, 1986.
- 1986
- 2 Items
Item details Format Call Number Item Location Text JFE 87-3826 v. 2 Schwarzman Building - General Research Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Item details Format Call Number Item Location Text JFE 87-3826 Schwarzman Building - General Research Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Robotic object recognition using vision and touch / by Peter K. Allen.
- Text
- Boston : Kluwer Academic Publishers, c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Text JSE 88-2273 Offsite Pattern recognition / Mike James.
- Text
- New York : Wiley, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JSE 88-3462 Offsite Syntactic and structural pattern recognition / edited by Gabriel Ferraté ... [et al.].
- Text
- Berlin ; New York : Springer-Verlag, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JSE 89-236 Offsite Adaptive pattern recognition and neural networks / Yoh-Han Pao.
- Text
- Reading, Mass. : Addison-Wesley, c1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text JSE 90-393 Offsite Neural and synergetic computers : proceedings of the International Symposium at Schloss Elmau, Bavaria, June 13-17, 1988 / Hermann Haken, ed.
- Text
- Berlin ; New York : Springer-Verlag, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JSE 90-28 Offsite Recent issues in pattern analysis and recognition / V. Cantoni ... [et al.], eds.
- Text
- New York : Springer-Verlag, 1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text JSE 90-452 Offsite Mustererkennung 1988 : 10. DAGM-Symposium, Zürich, 27.-29. September 1988 : Proceedings / H. Bunke, O. Kübler, P. Stucki (Hrsg.)
- Text
- Berlin ; New York : Springer-Verlag, 1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JSE 88-570 Offsite Image analysis applications / edited by Rangachar Kasturi, Mohan M. Trivedi.
- Text
- New York : M. Dekker, c1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text JSE 91-1597 Offsite Pattern recognition by self-organizing neural networks / edited by Gail A. Carpenter and Stephen Grossberg.
- Text
- Cambridge, Mass. : MIT Press, c1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text JSF 92-533 Offsite From pixels to features II : parallelism in image processing : proceedings of a workshop held at Bonas, France, August 27-September 1, 1990 / edited by H. Burkhardt, Y. Neuvo, J.C. Simon.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Text JSE 93-412 Offsite Visual form : analysis and recognition / edited by Carlo Arcelli, Luigi P. Cordella, and Gabriella Sanniti di Baja.
- Text
- New York : Plenum Press, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text JSF 93-211 Offsite A program generator for recognition, parsing and transduction with syntactic patterns / G.J. van der Steen.
- Text
- Amsterdam : Centrum voor Wiskunde en Informatica, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JSF 93-545 Offsite Pattern recognition engineering / Morton Nadler, Eric P. Smith.
- Text
- New York : Wiley, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSE 93-1010 Offsite Pattern recognition and image preprocessing / Sing-Tze Bow.
- Text
- New York : M. Dekker, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text JSE 93-1705 Offsite Pattern recognition letters.
- Text
- Amsterdam : North Holland Pub. Co., 1982-
- 1982-present
- 43 Items
Item details Format Call Number Item Location Text JSP 85-195 v. 28, no. 1-6 (Jan.-Apr. 2007) Offsite Item details Format Call Number Item Location Text JSP 85-195 v. 28, no. 13-16 (Oct.-Dec. 2007) Offsite Item details Format Call Number Item Location Text JSP 85-195 v. 28, no. 7-12 (May-Sept. 2007) Offsite Neural networks for pattern recognition / Albert Nigrin.
- Text
- Cambridge, Mass. : MIT Press, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSE 94-807 Offsite Advances in pattern recognition systems using neural network technologies / edited by I. Guyon, P.S.P. Wang.
- Text
- Singapore ; River Edge, NJ : World Scientific, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSF 94-609 Offsite
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