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Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate / Hyun Jung Kim ... [and others].
- Text
- Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2012]
- 2012
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo30968
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