Research Catalog

  • DEPEND [microform] : a simulation-based environment for system level dependability analysis / Kumar Goswami and Ravishankar K. Iyer.

    • Text
    • [Urbana, IL] : Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va.? : National Technical Information Service, distributor, 1992]
    • 1992
  • DEPEND [microform] : a design environment for prediction and evaluation of system dependability / Kumar K. Goswami and Ravishankar K. Iyer.

    • Text
    • [Urbana, IL] : Center for Reliable and High Performance Computing, Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign ; [Hampton, VA : NASA Langley ; Springfield, Va. : National Technical Information Service, distributor, 1990]
    • 1990
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS64093
  • Practical system reliability / Eric Bauer, Xuemei Zhang, Douglas A. Kimber.

    • Text
    • Piscataway, NJ : IEEE Press ; Hoboken, N.J. : Wiley, c2009.
    • 2009
    • 1 Item
    FormatCall NumberItem Location
    Book/Text TK5102.5 .B3448 2009gOff-site
  • Simulation methods for reliability and availability of complex systems / Javier Faulin ... [et al.], (editors).

    • Text
    • London ; New York : Springer, c2010.
    • 2010
    • 1 Item
    FormatCall NumberItem Location
    Text TA168 .S523 2010Off-site
  • Simulation methods for reliability and availability of complex systems / Javier Faulin [and others], (editors).

    • Text
    • London ; New York : Springer, ©2010.
    • 2010
    • 1 Item
    FormatCall NumberItem Location
    Book/Text TA168 .S523 2010Off-site

No results found from Digital Research Books Beta

Digital books for research from multiple sources world wide- all free to read, download, and keep. No Library Card is Required. Read more about the project.

digital-research-book
Explore Digital Research Books Beta