Research Catalog
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Displaying 1-3 of 3 results
Electronic characterization of defects in narrow gap semiconductors [microform] final report, November 25, 1992 to November 25, 1994 / James D. Patterson.
- Text
- Marshall Space Flight Center, AL : [National Aeronautics and Space Administration], George C. Marshall Space Flight Center ; [Springfield, Va. : National Technical Information Service, distributor, 1994]
- 1994
Electron diffraction evidence for the ordering of excess nickel atoms by relation to stoichiometry in nickel-rich B'-NiAl formation of a nickel-aluminum (Ni2Al) superlattice [microform] / F. Raynaud.
- Text
- Washington, DC : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1988]
- 1988
Structural properties of bismuth-bearing semiconductor alloys [microform] / Martha A. Berding and A. Sher, A.-B. Chen.
- Text
- [Washington, D.C.?] : National Aeronautics and Space Administration, Scientific and Technical Information Branch ; [Springfield, Va. : For sale by the National Technical Information Service], 1986.
- 1986
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