Research Catalog

  • Weibull-Analyse: System zur beschleunigten Fehlererfassung und seine Anwendung in der KFZ-Industrie, [von] H. L. Ohl. [2. Aufl.

    • Text
    • Rüsselsheim, Ger., Opel, 1974]
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Text JSK 76-252 v. 3-13Offsite
  • Weibull radar clutter / Matsuo Sekine & Yuhai Mao.

    • Text
    • London, UK : P. Peregrinus Ltd. on behalf of the Institution of Electrical Engineers, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 91-1985Offsite
  • Transmission overhaul estimates for partial and full replacement at repair [microform] / M. Savage and D.G. Lewicki.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [St. Louis, Mo.] : US Army Aviation Systems Command ; [Springfield, Va. : For sale by the National Technical Information Service, 1991]
    • 1991
  • Reliability analysis of structural ceramic components using a three-parameter Weibull distribution [microform] / Stephen F. Duffy and Lynn M. Powers, Alois Starlinger.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, 1992]
    • 1992
  • Fatigue criterion to system design, life and reliability--a primer [microform] / Erwin V. Zaretsky.

    • Text
    • [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1992]
    • 1992
  • Some bivariate distributions for modeling the strength properties of lumber [microform] / Richard A. Johnson, James W. Evans, David W. Green.

    • Text
    • Madison, WI (One Gifford Pinchot Dr., Madison 53705-2398) : U.S. Dept. of Agriculture, Forest Service, Forest Products Laboratory, [1999]
    • 1999
  • Weibull models / D.N. Prabhakar Murthy, Min Xie, Renyan Jiang.

    • Text
    • Hoboken, N.J. : Wiley-Interscience, c2004.
    • 2004
    • 1 Item

    Available Online

    http://www.loc.gov/catdir/toc/wiley032/2003053450.html
    FormatCall NumberItem Location
    Text JSE 04-122Offsite
  • An overview of engineering concepts and current design algorithms for probabilistic structural analysis [microform] / S.F Duffy, J. Hu, D.A. Hopkins.

    • Text
    • Cleveland, Ohio : NASA Lewis Research Center, [1995]
    • 1995
  • Censoring data for resistance factor calculations in load and resistance factor design [electronic resource] : a preliminary study / James W. Evans, David W. Green.

    • Text
    • Madison, WI : U.S. Dept. of Agriculture, Forest Service, Forest Products Laboratory, [2007]
    • 2007
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS105409
  • The Weibull distribution : a handbook / Horst Rinne.

    • Text
    • Boca Raton : CRC Press, c2009.
    • 2009
    • 1 Item
    FormatCall NumberItem Location
    Text JBF 10-492 Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • The new Weibull handbook / Robert B. Abernethy.

    • Text
    • North Palm Beach, Fla. : R.B. Abernethy ; Houston : Distributed by Gulf Pub. Co., 1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Text TA169 .A35 1996Off-site
  • Some contributions to problems of Weibull failure processes.

    • Text
    • [New York], 1962.
    • 1962
    • 2 Items
    FormatCall NumberItem Location
    Text FC63- 1498Off-site
    FormatCall NumberItem Location
    Text 620.1 K14Off-site
  • Metoda Weibull : aplicații / Alexandru Isaic-Maniu.

    • Text
    • București : Editura Academiei Republicii Socialiste România, 1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Text QA273.6 .I8 1983Off-site
  • Factors and procedures for applying MIL-STD-105D sampling plans to life and reliability testing / [prepared by Henry P. Goode under an Office of Naval Research contract]

    • Text
    • Washington, D.C. : Office of the Assistant Secretary of Defense (Installations and Logistics), [1965]
    • 1965
    • 1 Item
    FormatCall NumberItem Location
    Text QA276.6.G662 1965Off-site
  • Inferential procedures for the Weibull and generalized gamma distributions [by] Lee J. Bain [and Charles E. Antle].

    • Text
    • [Springfield, Va.] National Technical Information Service, 1970.
    • 1970
    • 1 Item
    FormatCall NumberItem Location
    Text QA273.6.xB3Off-site

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