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  • Advanced tomographic imaging methods for the analysis of materials : symposium held November 28-30, 1990, Boston, Massachusetts, U.S.A. / editors, Jerome L. Ackerman, William A. Ellingson.

    • Text
    • Pittsburgh, Pa. : Materials Research Society, c1991.
    • 1991
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 92-1907Offsite

  • X-ray microscopy and X-ray microanalysis; proceedings. Edited by A. Engström, V. Cosslett [and] H. Pattee.

    • Text
    • Amsterdam, New York, Elsevier Pub. Co., 1960.
    • 1960
    • 1 Item
    FormatCall NumberItem Location
    Text PEW (International Symposium on X-ray Microscopy and X-ray Microanalysis. 2d, Stockholm, 1959. X-ray microscopy and X-ray microanalysis)Offsite

  • X-ray microscopy : proceedings of the sixth international conference, Berkeley, CA, 2-6 August 1999 / editors, Werner Meyer-Ilse, Tony Warwick, David Attwood.

    • Text
    • Melville, N.Y. : American Institute of Physics, c2000.
    • 2000
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 00-1775Offsite

  • Three-dimensional x-ray diffraction microscopy : mapping polycrystals and their dynamics / Henning F. Poulsen.

    • Text
    • Berlin : Springer, 2004.
    • 2004
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 04-1556Offsite

  • X-ray microanalysis in biology and medicine.

    • Text
    • Amsterdam ; New York : Elsevier Pub. Co., 1962.
    • 1962
    • 1 Item
    FormatCall NumberItem Location
    Text 621.329 En37Off-site

  • Ultrasoft x-ray microscopy : its application to biological and physical sciences / edited by Donald F. Parsons.

    • Text
    • New York, N.Y. : New York Academy of Sciences, 1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text Q11 .N42 v.342Off-site

  • X-ray microscopy : proceedings of the sixth international conference, Berkeley, CA, 2-6 August 1999 / editors, Werner Meyer-Ilse, Tony Warwick, David Attwood.

    • Text
    • Melville, N.Y. : American Institute of Physics, [2000], ©2000.
    • 2000-2000
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.X2 I58 1999gOff-site

  • X-ray micro- and nano-focusing : applications and techniques II : 30 July 2001, San Diego, USA / Ian McNulty, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, [2001], ©2001.
    • 2001-2001
    • 1 Item
    FormatCall NumberItem Location
    Text TA1775 .X736 2001gOff-site

  • X-ray microanalysis in biology and medicine.

    • Text
    • Amsterdam ; New York : Elsevier Pub. Co., 1962.
    • 1962
    • 1 Item
    FormatCall NumberItem Location
    Text QC373.X2 En3 1962Off-site

  • X-ray microscopy and microradiography; proceedings. Edited by V.E. Cosslett, Arne Engström [and] H.H. Pattee, Jr.

    • Text
    • New York, Academic Press, 1957.
    • 1957
    • 1 Item
    FormatCall NumberItem Location
    Text QC373.X2 In82 1956Off-site

  • X-ray microscopy and X-ray microanalysis ; proceedings / Edited by A. Engström, V. Cosslett [and] H. Pattee.

    • Text
    • Amsterdam ; New York : Elsevier Pub. Co., 1960.
    • 1960
    • 1 Item
    FormatCall NumberItem Location
    Text QC373.X2 In82 1959Off-site

  • X-ray microscopy in clinical and experimental medicine / by T. A. Hall, H. O. E. Röckert [and] R. L. deC. H. Saunders.

    • Text
    • Springfield, Ill. : Thomas, [1972], [©1972]
    • 1972-1972
    • 1 Item
    FormatCall NumberItem Location
    Text RC78.7.M5 H14 1972Off-site

  • Three-dimensional X-ray diffraction microscopy : mapping polycrystals and their dynamics / Henning F. Poulsen.

    • Text
    • Berlin ; New York : Springer, [2004], ©2004.
    • 2004-2004
    • 1 Item
    FormatCall NumberItem Location
    Text 508 Er38 v.205Off-site

  • X-ray microscopy and X-ray microanalysis; proceedings. Edited by A. Engström, V. Cosslett [and] H. Pattee.

    • Text
    • Amsterdam, New York, Elsevier, 1960.
    • 1960
    • 1 Item
    FormatCall NumberItem Location
    Text WN 100 I47x 1959Off-site

  • X-ray microbeam technology and applications : 11-12 July, 1995, San Diego, California / Wenbing Yun, chair/editor ; sponsored and published by SPIE--The International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.X2 X729 1995Off-site

  • X-ray microanalysis in biology and medicine.

    • Text
    • Amsterdam, New York, Elsevier Pub. Co., 1962.
    • 1962
    • 1 Item
    FormatCall NumberItem Location
    Text 8294.327Off-site

  • X-ray microscopy : proceedings of the sixth international conference, Berkeley, CA, 2-6 August 1999 / editors, Werner Meyer-Ilse, Tony Warwick, David Attwood.

    • Text
    • Melville, N.Y. : American Institute of Physics, c2000.
    • 2000
    • 2 Items
    FormatCall NumberItem Location
    Text Off-site
    Not available - Please for assistance.
    FormatCall NumberItem Location
    Text QH212.X2 I58 1999Off-site

  • X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography : proceedings : 9-13 July 1990, San Diego, California / Richard B. Hoover, Arthur B.C. Walker, Jr., chairs/editors : sponsored by SPIE--the International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1991.
    • 1991
    • 2 Items
    FormatCall NumberItem Location
    Text Off-site
    Not available - Please for assistance.
    FormatCall NumberItem Location
    Text QB472 .X73Off-site

  • Instrumententwicklung in der Nanotechnologie am Beispiel des transmittierenden Röntgenmikroskops der Universitätssternwarte Göttingen / Andreas Junk.

    • Text
    • Diepholz : Verlag für Geschichte der Naturwissenschaften und der Technik, 2013.
    • 2013
    • 1 Item
    FormatCall NumberItem Location
    Text QH212 .X2J86 2013Off-site

  • X-ray microbeam technology and applications : 11-12 July, 1995, San Diego, California / Wenbing Yun, chair/editor ; sponsored and published by SPIE--The International Society for Optical Engineering.

    • Text
    • Bellingham, Wash., USA : SPIE, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.X2 X729 1995Off-site

  • X-ray microscopy, by V.E. Cosslett and W.C. Nixon.

    • Text
    • Cambridge, University Press, 1960.
    • 1960
    • 1 Item
    FormatCall NumberItem Location
    Text 8294.269Off-site

  • X-ray microanalysis in biology and medicine.

    • Text
    • Amsterdam : Elsevier, 1962.
    • 1962
    • 1 Item
    FormatCall NumberItem Location
    Text 8294.327Off-site

  • X-ray microscopy : proceedings of the sixth international conference, Berkeley, CA, 2-6 August 1999 / editors, Werner Meyer-Ilse, Tony Warwick, David Attwood.

    • Text
    • Melville, N.Y. : American Institute of Physics, c2000.
    • 2000
    • 1 Item
    FormatCall NumberItem Location
    Text QH212.X2 I58 1999Off-site

  • Ultrasoft x-ray microscopy : its application to biological and physical sciences / edited by Donald F. Parsons.

    • Text
    • New York, N.Y. : New York Academy of Sciences, 1980.
    • 1980
    • 1 Item
    FormatCall NumberItem Location
    Text 8001.604.2 vol.342Off-site

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